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LVR Datasheet(PDF) 2 Page - Ohmite Mfg. Co.

Part # LVR
Description  Low-TCR Current Sense Chips
PDF  3 Pages
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Manufacturer  OHMITE [Ohmite Mfg. Co.]
Direct Link  http://www.ohmite.com
Logo OHMITE - Ohmite Mfg. Co.

LVR Datasheet(HTML) 2 Page - Ohmite Mfg. Co.

  LVR Datasheet HTML 1Page - Ohmite Mfg. Co. LVR Datasheet HTML 2Page - Ohmite Mfg. Co. LVR Datasheet HTML 3Page - Ohmite Mfg. Co.  
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1-866-9-OHMITE • Int’l 1-847-258-0300 • Fax 1-847-574-7522 • www.ohmite.com • info@ohmite.com
13
LVR Series
Low-TCR Current Sense Chips
pe R fo R mance data
Test Method
Procedure
Requirements
Short time
overload
IEC60115-1 4.13
2.5 times of rated power for 5 seconds at room temperature
±(1%+0.0005Ω)
No visible damage
High
Temperature
Exposure
MIL-STD-202-Method
108
1,000 hours at maximum operating temperature depending on speci-
fication, unpowered. No direct impingement of forced air to the parts
Tolerances: 125±5ºC
±(1.0%+0.0005Ω)
Moisture
Resistance
MIL-STD-202-Method
106
Each temperature / humidity cycle is defined at 8 hours (method 106F),
3 cycles / 24 hours for 10d with 25ºC / 65ºC 95% R.H, without steps 7a
& 7b, unpowered
±(0.5%+0.0005Ω)
Operational
Life/
Endurance
MIL-STD-202 Method
108
IEC 60115-1 4.25.1
1,000 hours at 70±2ºC applied RCWV. 1.5 hours on, 0.5 hour off, still air
required
±(1.0%+0.0005Ω)
Solderability -
Wetting
J-STD-002 test B
Electrical Test not required. Magnification 50X. SMD conditions: 1st step
: method B, aging 4 hours at 155°C dry heat; 2nd step: leadfree solder
bath at 245±3°C; Dipping time: 3± 0.5 seconds
Well tinned (>95% covered)
No visible damage
Moisture
Resistance
MIL-STD-202 Method
106
Each temperature / humidity cycle is defined at 8 hours (Method 106G),
3 cycles / 24 hours for 10d. with 25°C / 65°C 95% R.H, without steps 7a
& 7b, un-powered Parts mounted on test board, without condensation
on parts. Measurement at 24±2 hours after test conclusion.
±(0.5% + 0.0005Ω)
No visible damage
Thermal
Shock
MIL-STD-202 Method
107
-55/+125°C. Number of cycles required is 300. Parts mounted on test
board. Maximum transfer time is 20 seconds. Dwell time is 15 minutes.
±(1.0% + 0.0005Ω)
Board Flex/
Bending
IEC 60115-1 4.33
Device mounted on PCB test board as described, only 1 board bend-
ing required. 2 mm bending. Bending time: 60±1 seconds. Ohmic value
checked during bending
±(1.0 % + 0.0005Ω)
Resistance
to Soldering
Heat
MIL-STD-202 Method
210
IEC 60115-1 4.18
Condition B, no pre-heat of samples. Leadfree solder, 260±5°C,
10±1seconds immersion time. Procedure 2 for SMD: devices fluxed and
cleaned with isopropanol
±(0.5% + 0.0005Ω)
No visible damage



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