ZXCT1107Q/09Q/10Q

Document number: DS37002 Rev. 3 - 2

2 of 17

www.diodes.com

October 2018

© Diodes Incorporated

ZXCT1107Q/09Q/10Q

Pin Descriptions

Package

SOT23

SOT25

Description

Name

ZXCT1107Q

ZXCT1109Q

ZXCT1110Q

OUT

1

1

3

Output pin (Note 5). Current output.

S+

3

2

4

This is the positive input of the current monitor and has a wide common-mode

input range. This also acts as the analog supply and provides power to internal

circuitry. The current through this pin varies with differential sense voltage.

S-

2

3

5

This is the negative input of the current monitor and has a wide common-mode

input range.

GND

—

—

2

Ground pin and substrate connection.

NC

—

—

1

No connection.

Note:

5. For the ZXCT1107Q and ZXCT1109Q pin 1 (OUT) acts as both the output pin and substrate connection. This means that for the ZXCT1107Q and

Absolute Maximum Ratings

Description

Rating

Unit

Voltage on S- and S+ relative to OUT (ZXCT1107Q/09Q)

-0.3 to 40

V

Voltage on S- and S+ relative to GND (ZXCT1110Q)

-0.3 to 40

V

Voltage on OUT to GND (ZXCT1110Q)

V

-0.3 to +0.8

V

Maximum Current into S+ and S- (Note 7)

±8.5

mA

Storage Temperature

-55 to +150

°C

Maximum Junction Temperature

+150

°C

SOT23

SOT25

300 (Derate to Zero at +150°C)

300 (Derate to Zero at +150°C)

mW

ESD Ratings

ZXCT1107Q/09Q

HBM

Human Body Model

1,500

V

MM

Machine Model

150

V

CDM

Charged Device Model

1,000

V

ZXCT1110Q

HBM

Human Body Model

1,000

V

MM

Machine Model

150

V

CDM

Charged Device Model

1,000

V

Notes:

Caution:

Stresses greater than the 'Absolute Maximum Ratings' specified above, may cause permanent damage to the device. These are stress ratings only;

functional operation of the device at conditions between maximum recommended operating conditions and absolute maximum ratings is not implied.

Device reliability may be affected by exposure to absolute maximum rating conditions for extended periods of time.

Semiconductor devices are ESD sensitive and may be damaged by exposure to ESD events. Suitable ESD precautions should be taken when handling

and transporting these devices.)