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2865366 Datasheet(PDF) 13 Page - PHOENIX CONTACT |
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2865366 Datasheet(HTML) 13 Page - PHOENIX CONTACT |
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13 / 16 page ![]() MACX MCR-EX-SL-RPSSI-2I(-SP) 106034_en_00 PHOENIX CONTACT 13 The probability of a dangerous failure per hour for “continuous demand” mode and the average probability of failure of the specified function for “low demand” mode are determined based on the error rates: PFD avg values depending on operating mode A – D This fulfills the requirements for the PFH value for a SIL 2 system. When calculating the PFD avg and PFH values for the partial 2-channel operating mode (C and D) failures of the same cause where taken into account and a β or β D factor of 2% was determined. The boxes marked in gray mean that the calculated PFD avg values are within the allowed range for SIL 2 according to table 2 of IEC/EN 61508-1. They fulfill the requirement to not cover more than 10% of the safety circuit, i.e., to be better than or equal to 1.00E-03. The box marked in white shows that the calculated PFD avg values are within the permissible range for SIL2 in accordance with Table 2 of IEC/EN 61508-1. However, they do not fulfill the requirement to not cover more than 10% of this safety circuit, i.e., to be better than or equal to 1.00 E03. Failure limit In SIL2 applications, if the percentage of the device for the entire safety circuit is assumed to be a maximum of 10%, a maintenance/test interval of 4.26 years can be achieved in this time depending on the operating mode: Figure 7 Safety circuit The maintenance/test interval depends on the characteristic data of all devices involved in the safety circuit. The intervals may be shorter or longer depending on this characteristic data. 7.3 Condition The values are valid under the following conditions: – The failure rates of the components used remain constant throughout the period of use. – The propagation of errors by the device in the system is not taken into consideration. – The failure rates of the external power supply are not taken into consideration. – The specified error rates are based on an average ambient temperature of +40 °C. For an average ambient temperature of +60 °C, the specified failure rates must be multiplied by a factor of 2.5. This factor is based on guide values. A T [PROOF] = 1 year 3 years 4 years PFD avg = 2.73E-04 8.19E-04 10.9E-04 PFH = 6.23 * 10 -8 /h B T [PROOF] = 1 year 4 years 5 years PFD avg = 2.34E-04 9.37E-04 11.7E-04 PFH = 5.34 * 10 -8 /h C T [PROOF] = 1 year 5 years 6 years PFD avg = 1.86E-04 9.29E-04 11.1E-04 PFH = 4.31 * 10 -8 /h D T [PROOF] = 1 year 6 Jahre 7 years PFD avg = 1.47E-04 8.81E-04 10.3E-04 PFH = 3.43 * 10 -8 /h A 3.66 years B 4.26 years C 5.26 years D 6.80 years Sensor 25% Device < 10% Processing 15% Actuator 50% |
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