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SDT3585S Datasheet(PDF) 3 Page - SeCoS Halbleitertechnologie GmbH

Part # SDT3585S
Description  N & P-Ch Enhancement Mode MOSFET
PDF  7 Pages
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Manufacturer  SECOS [SeCoS Halbleitertechnologie GmbH]
Direct Link  http://www.secosgmbh.com
Logo SECOS - SeCoS Halbleitertechnologie GmbH

SDT3585S Datasheet(HTML) 3 Page - SeCoS Halbleitertechnologie GmbH

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Elektronische Bauelemente
SDT3585S
& P-Ch Enhancement Mode MOSFET
-Ch: 5A, 20V, RDS(O ) 37 mΩ
Ω
Ω
Ω
P-Ch: -3.5A, -20V, RDS(O ) 75 mΩ
Ω
Ω
Ω
12-Sep-2017 Rev. A
Page 3 of 7
http://www.SeCoSGmbH.com/
Any changes of specification will not be informed individually.
P-CH ELECTRICAL CHARACTERISTICS (T
J=25°C unless otherwise specified)
Parameter
Symbol
Min
Typ
Max
Unit
Test Condition
Drain-Source Breakdown Voltage
BVDSS
-20
-
-
V
VGS=0, ID= -250µA
Breakdown Voltage Temperature
Coefficient
BV
△
DSS/
Tj
△
-
-0.01
-
V/°C
Reference to 25°C,ID= -1mA
Gate-Threshold Voltage
VGS(th)
-0.5
-
-1.2
V
VDS=VGS, ID= -250µA
Forward Transfer conductance
gFS
-
9
-
S
VDS= -5V, ID= -3A
Gate-Body Leakage Current
IGSS
-
-
±100
nA
VDS=0,VGS= ±12V
-
-
-1
VDS= -16V, VGS=0,TJ=25°C
Zero Gate Voltage Drain Current
IDSS
-
-
-5
µA
VDS= -16V, VGS=0,TJ=55°C
-
-
75
VGS= -4.5V, ID= -3A
Drain-Source On-Resistance
4
RDS(ON)
-
-
105
m
VGS= -2.5V, ID= -2A
Total Gate Charge
Qg
-
9.7
-
Gate-Source Charge
Qgs
-
2.05
-
Gate-Drain Charge
Qgd
-
2.43
-
nC
VDS= -15V
VGS= -4.5V
ID= -3A
Turn-On Delay Time
Td(ON)
-
4.8
-
Rise Time
Tr
-
9.6
-
Turn-Off Delay Time
Td(OFF)
-
52
-
Fall Time
Tf
-
8.4
-
nS
VDS= -10V
VGS= -4.5V
ID= -3A
RG=3.3
RD=3.33
Input Capacitance
Ciss
-
686
-
Output Capacitance
Coss
-
90.8
-
Reverse Transfer Capacitance
Crss
-
80.4
-
pF
VDS= -15V
VGS=0
f=1MHz
Source-Drain Diode
Continuous Source Current
1
IS
-3.5
A
Pulsed Source Current
3
ISM
-12
A
Forward On Voltage
4
VSD
-0.7
-1.2
V
IS= -1A, VGS=0V
Reverse Recovery Time
Trr
-
8.4
-
ns
Reverse Recovery Charge
Qrr
-
3.3
-
nC
IS= -3A,VGS=0V,
dI/dt=100A/µs
Notes:
1.
Surface mounted on a 1 inch
2 FR-4 board with 2OZ copper.
2.
Surface mounted on FR4 Board using the minimum recommended pad size
3.
Pulse width limited by maximum junction temperature
4.
The data tested by pulsed , pulse width ≦ 300µs , duty cycle ≦ 2%



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