AI Functions Allow Measuring

A preliminary measuring mode selects measuring

conditions automatically and a lesson mode provides

the operator with guidance on operating procedures,

making it easy for just about anyone to perform

operations.

A customize function can be used to configure the

screen with only the icons that are needed, greatly

enhancing ease of use.

Functions that Meet the Needs of the User

Standard functions included with the system include

step and surface measuring that facilitates evaluation

of printed circuit board film thickness, an overlap

function that makes it possible to compare wear

evaluations, and more.

Versatile Measured Data Analysis (Patented)

Once data is captured, the measuring reference (line,

first half, latter half, round surface, both ends, spline)

can be changed for reanalysis. The standard can also

be changed for reanalysis as many times as desired.

Fully Automated Measuring Maximizes Efficiency

Teaching functions include column down, tracing

driver, and a tilt device operation which fully automates

everything from measuring to inspection report gener-

ation.

16% Rule Automatic Pass/Fail Judgment

(Complies with JIS2001)

The 16% rule and max rule are the permissible error

standards for roughness evaluation parameters. These

rules can be configured in the roughness analysis

window. According to the 16% rule, not more than 16%

of the measured values for multiple reference lengths

can be greater than the tolerance value.

According to the max rule, the measured value should

not exceed the specified tolerance value.

Measuring screen

Analysis screen

Lesson mode

Superimposition

As the probe traces the surface of the workpiece, the computer detects the highest point

and lowest point, and notifies the operator of their positions. Y-direction detection is sup-

ported through the use of a CNC table.

Setup screen

Maximum point

of the specified

sampling range

is detected and

moved

Column moves from

maximum point to

measuring range

maximum value and the

distance is measured

Measuring

Range

TiMS

TiMS is short for "TOKYO SEIMITSU Integrated Mea-

suring System." It is an advanced system that provides

unrestricted access to data produced by Tokyo Seimitsu

measuring machines.

TiMS is currently being used by a large number of satisfied

customers all around the world.

Easy to operate

An AI function, customize

function, auto measuring range

expansion function, and much

more help achieve our goal of

building measuring systems

that can be used by anyone

(Patented).

Specifications

TiMS Roughness Measurement and Analysis Program

Standard

Complies with JIS2001, JIS1994, JIS1982, ISO1997, ISO1984, DIN1990, ASME1995, CNOMO

Parameter

Ra, Rq, Ry, Rp, Rv, Rc, Rz, Rmax, Rt, Rz.J, R3z, Sm, S, RΔa, RΔq, Rλa, Rλq, TILT A, Ir, Pc, Rsk, Rku, Rk, Rpk, Rvk, Mr1, Mr2, VO, K, tp, Rmr, Rmr2, Rσc, AVH, Hmax, Hmin, AREA,

NCRX, R, Rx, AR, NR, CPM, SR, SAR (Parameter judgment: The judgment result can be displayed by average value, the maximum value, minimum value, and 16% rule)

Evaluation curve

Profile curve, roughness curve, filtered waiveness curve, filtered center line waviness curve, rolling circle waiveness curve,

rolling circle center line waiveness curve, DIN4776 special curve, roughness motif curve, waiveness motif curve, envelope waviness curve

Surface characteristic graph

Bearing area curve, power spectrum curve, amplitude distribution graph

Tilt correction

Linear correction, round surface correction, first half linear correction, latter half linear correction, both end linear,

spline curve correction (linear correction and round surface correction can be possible in arbitrary range)

Filter type

Gaussian phase compensation filter, standard 2RC filter, phase compensation 2RC filters, spline filter, robust (spline) filter

Filter

Cutoff wavelength (λc): 0.008, 0.025, 0.08, 0.25, 0.8, 2.5, 8, 25, 50 mm (9 levels), arbitrary (from 0.001 mm to 50 mm) Cutoff ratio (λs): 1/30, 1/100, 1/300, 1/1000

Cutoff wavelength (λs): 0.08, 0.25, 0.8, 2.5, 8, 25, 80 μm

Number of data points

32000 max. (without λs filter), 300000 max. (with λs filter)

Magnification display

Vertical: 50 to 2000 k times (arbitrary from 1 time), Horizontal: 1 to 20 k times (arbitrary from 0.1 time)

Surface Texture – Contour

Measuring Instruments

Software

Surface Roughness Measurement and Analysis Program

Continually Improving Analysis Versatility

and Expanding Analysis Scope

TiMS Integrated

Measuring System Software

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TOKYO SEIMITSU