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AM5728 Datasheet(PDF) 185 Page - Texas Instruments

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Part # AM5728
Description  Sitara Processors Silicon Revision 2.0
PDF  415 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

AM5728 Datasheet(HTML) 185 Page - Texas Instruments

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185
AM5729, AM5728, AM5726
www.ti.com
SPRS953F – DECEMBER 2015 – REVISED MAY 2019
Submit Documentation Feedback
Product Folder Links: AM5729 AM5728 AM5726
Specifications
Copyright © 2015–2019, Texas Instruments Incorporated
Table 5-11. Dual Voltage LVCMOS I2C DC Electrical Characteristics (continued)
PARAMETER
MIN
NOM
MAX
UNIT
IOZ
IOZ(IPAD Current) for BIDI cell. This current is
contributed by the tristated driver leakage + input
current of the Rx + weak pullup/pulldown leakage.
PAD is swept from 0 to VDDS and the Max(I(PAD))
is measured and is reported as IOZ
12
µA
CIN
Input capacitance
10
pF
VOL3
Output low-level threshold open-drain at 3-mA
sink current
0.2*VDDS
V
IOLmin
Low-level output current @VOL=0.2*VDDS
3
mA
tOF
Output fall time from VIHmin to VILmax with a bus
capacitance CB from 10 pF to 400 pF
20+0.1*Cb
250
ns
I2C Standard Mode – 3.3 V
VIH
Input high-level threshold
0.7*VDDS
V
VIL
Input low-level threshold
0.3*VDDS
V
Vhys
Hysteresis
0.05*VDDS
V
IIN
Input current at each I/O pin with an input voltage
between 0.1*VDDS to 0.9*VDDS
31
80
µA
IOZ
IOZ(IPAD Current) for BIDI cell. This current is
contributed by the tristated driver leakage + input
current of the Rx + weak pullup/pulldown leakage.
PAD is swept from 0 to VDDS and the Max(I(PAD))
is measured and is reported as IOZ
31
80
µA
CIN
Input capacitance
10
pF
VOL3
Output low-level threshold open-drain at 3-mA
sink current
0.4
V
IOLmin
Low-level output current @VOL=0.4V
3
mA
IOLmin
Low-level output current @VOL=0.6V for full drive
load (400pF/400KHz)
6
mA
tOF
Output fall time from VIHmin to VILmax with a bus
capacitance CB from 5 pF to 400 pF
250
ns
I2C Fast Mode – 3.3 V
VIH
Input high-level threshold
0.7*VDDS
V
VIL
Input low-level threshold
0.3*VDDS
V
Vhys
Hysteresis
0.05*VDDS
V
IIN
Input current at each I/O pin with an input voltage
between 0.1*VDDS to 0.9*VDDSS
31
80
µA
IOZ
IOZ(IPAD Current) for BIDI cell. This current is
contributed by the tristated driver leakage + input
current of the Rx + weak pullup/pulldown leakage.
PAD is swept from 0 to VDDS and the Max(I(PAD))
is measured and is reported as IOZ
31
80
µA
CIN
Input capacitance
10
pF
VOL3
Output low-level threshold open-drain at 3-mA
sink current
0.4
V
IOLmin
Low-level output current @VOL=0.4V
3
mA
IOLmin
Low-level output current @VOL=0.6V for full drive
load (400pF/400KHz)
6
mA
tOF
Output fall time from VIHmin to VILmax with a bus
capacitance CB from 10 pF to 200 pF (Proper
External Resistor Value should be used as per
I2C spec)
20+0.1*Cb
250
ns
Output fall time from VIHmin to VILmax with a bus
capacitance CB from 300 pF to 400 pF (Proper
External Resistor Value should be used as per
I2C spec)
40
290



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