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LC4512Z Datasheet(PDF) 39 Page - Lattice Semiconductor |
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LC4512Z Datasheet(HTML) 39 Page - Lattice Semiconductor |
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39 / 91 page  Lattice Semiconductor ispMACH 4000V/B/C/Z Family Data Sheet 39 Boundary Scan Waveforms and Timing Specifications Symbol Parameter Min. Max. Units tBTCP TCK [BSCAN test] clock cycle 40 — ns tBTCH TCK [BSCAN test] pulse width high 20 — ns tBTCL TCK [BSCAN test] pulse width low 20 — ns tBTSU TCK [BSCAN test] setup time 8 — ns tBTH TCK [BSCAN test] hold time 10 — ns tBRF TCK [BSCAN test] rise and fall time 50 — mV/ns tBTCO TAP controller falling edge of clock to valid output — 10 ns tBTOZ TAP controller falling edge of clock to data output disable — 10 ns tBTVO TAP controller falling edge of clock to data output enable — 10 ns tBTCPSU BSCAN test Capture register setup time 8 — ns tBTCPH BSCAN test Capture register hold time 10 — ns tBTUCO BSCAN test Update reg, falling edge of clock to valid output — 25 ns tBTUOZ BSCAN test Update reg, falling edge of clock to output disable — 25 ns tBTUOV BSCAN test Update reg, falling edge of clock to output enable — 25 ns |
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