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ASM5I9352 Datasheet(PDF) 4 Page - Alliance Semiconductor Corporation |
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ASM5I9352 Datasheet(HTML) 4 Page - Alliance Semiconductor Corporation |
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4 / 12 page ![]() July 2005 ASM5I9352 rev 0.2 2.5V or 3.3V, 200 MHz, 11-Output Zero Delay Buffer 4 of 12 Notice: The information in this document is subject to change without notice. Table 1: Frequency Table VCO_SEL Feedback Output Divider VCO Input Frequency Range (AVDD = 3.3V) Input Frequency Range (AVDD = 2.5V) 0 ÷2 Input Clock * 2 100 MHz to 200 MHz 100 MHz to 200 MHz 0 ÷4 Input Clock * 4 50 MHz to 125 MHz 50 MHz to 100 MHz 0 ÷6 Input Clock * 6 33.33 MHz to 83.33 MHz 33.33 MHz to 66.67 MHz 1 ÷2 Input Clock * 4 50 MHz to 125 MHz 50 MHz to 100 MHz 1 ÷4 Input Clock * 8 25 MHz to 62.5 MHz 25 MHz to 50 MHz 1 ÷6 Input Clock * 12 16.67 MHz to 41.67 MHz 16.67 MHz to 33.33 MHz Table 2: Function Table Control Default 0 1 VCO_SEL 0 VCO VCO ÷ 2 PLL_EN# 0 PLL enabled. The VCO output connects to the output dividers Bypass mode, PLL disabled. The input clock connects to the output dividers MR/OE# 0 Outputs enabled Outputs disabled (three-state), VCO running at its minimum frequency SELA 0 QA = VCO÷4 QA = VCO÷6 SELB 0 QB = VCO ÷4 QB = VCO÷2 SELC 0 QC = VCO÷2 QC = VCO÷4 Absolute Maximum Ratings Parameter Description Condition Min Max Unit VDD DC Supply Voltage –0.3 5.5 V VDD DC Operating Voltage Functional 2.375 3.465 V VIN DC Input Voltage Relative to VSS –0.3 VDD+ 0.3 V VOUT DC Output Voltage Relative to VSS –0.3 VDD+ 0.3 V VTT Output termination Voltage VDD ÷2 V LU Latch Up Immunity Functional 200 mA RPS Power Supply Ripple Ripple Frequency < 100 kHz 150 mVp-p TS Temperature, Storage Non Functional –65 +150 °C TA Temperature, Operating Ambient Functional –40 +85 °C TJ Temperature, Junction Functional 155 °C ØJC Dissipation, Junction to Case Functional 42 °C/W ØJA Dissipation, Junction to Ambient Functional 105 °C/W ESDH ESD Protection (Human Body Model) 2000 Volts FIT Failure in Time Manufacturing test 10 ppm Note: These are stress ratings only and functional operation is not implied. Exposure to absolute maximum ratings for extended periods may affect device reliability. |
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