AT28C010 datasheet(11/31 Pages) MICROCHIP

Part #	AT28C010

Description	Military Grade 1-Mbit (131,072 x 8) Paged Parallel EEPROM

PDF	31 Pages

Scroll/Zoom	100%

Manufacturer	MICROCHIP [Microchip Technology]

Direct Link	http://www.microchip.com

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11 / 31 page

Note:

CE may be delayed up to tACC‑tCE after the address transition without impact on tACC.

OE may be delayed up to tCE‑tOE after the falling edge of CE without impact on tCE or by tACC‑tOE after an

address change without impact in tACC.

tDF is specified from OE or CE, whichever occurs first (CL = 5 pF).

This parameter is characterized and is not 100% tested.

If CE is de-asserted, it must remain de-asserted for at least 50 ns during read operations, otherwise incorrect

data may be read.

5.3

AC Read Waveforms

High-Z

ACC

5.4

Input Test Waveforms and Measurement Level

DRIVING

LEVELS

MEASUREMENT

LEVELS

3.0V

0.0V

1.5V

5.5

Output Test Load

5.0V

1.8K

1.3K

OUTPUT

100 pF

AT28C010

Device Operation

DS20006311A-page 11

AT28C010 Datasheet(PDF) 11 Page - Microchip Technology