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DFDF2812ZHHAR Datasheet(PDF) 73 Page - Texas Instruments |
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DFDF2812ZHHAR Datasheet(HTML) 73 Page - Texas Instruments |
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73 / 175 page ![]() 8.12.5.15.7 Sequential Sampling Mode (Single-Channel) (SMODE = 0) In sequential sampling mode, the ADC can continuously convert input signals on any of the channels (Ax to Bx). The ADC can start conversions on event triggers from the Event Managers (EVA/EVB), software trigger, or from an external ADCSOC signal. If the SMODE bit is 0, the ADC will do conversions on the selected channel on every Sample/Hold pulse. The conversion time and latency of the Result register update are explained below. The ADC interrupt flags are set a few SYSCLKOUT cycles after the Result register update. The selected channels will be sampled at every falling edge of the Sample/Hold pulse. The Sample/Hold pulse width can be programmed to be 1 ADC clock wide (minimum) or 16 ADC clocks wide (maximum). Analog Input on Channel Ax or Bx ADC Clock Sample and Hold SH Pulse SMODE Bit t dschx_n t dschx_n+1 Sample n Sample n+1 Sample n+2 t SH ADC Event Trigger from EV or Other Sources t d(SH) Figure 8-37. Sequential Sampling Mode (Single-Channel) Timing 8.12.5.15.7.1 Sequential Sampling Mode Timing SAMPLE n SAMPLE n + 1 AT 25-MHz ADC CLOCK, tc(ADCCLK) = 40 ns REMARKS td(SH) Delay time from event trigger to sampling 2.5tc(ADCCLK) tSH Sample/ Hold width/ Acquisition width (1 + Acqps) * tc(ADCCLK) 40 ns with Acqps = 0 Acqps value = 0–15 ADCTRL1[8:11] td(schx_n) Delay time for first result to appear in the Result register 4tc(ADCCLK) 160 ns td(schx_n+1) Delay time for successive results to appear in the Result register (2 + Acqps) * tc(ADCCLK) 80 ns www.ti.com TMS320F2810, TMS320F2810-Q1, TMS320F2811, TMS320F2811-Q1 TMS320F2812, TMS320F2812-Q1 SPRS174V – APRIL 2001 – REVISED FEBRUARY 2021 Copyright © 2021 Texas Instruments Incorporated Submit Document Feedback 73 Product Folder Links: TMS320F2810 TMS320F2810-Q1 TMS320F2811 TMS320F2811-Q1 TMS320F2812 TMS320F2812-Q1 |
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