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MAX32010 Datasheet(PDF) 1 Page - Maxim Integrated Products |
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MAX32010 Datasheet(HTML) 1 Page - Maxim Integrated Products |
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1 / 31 page  Click here for production status of specific part numbers. MAX32010 25V Span, 1.2A Device Power Supply (DPS) www.maximintegrated.com 19-100946; Rev 0; 11/20 General Description The MAX32010 provides all the key features of a device power supply (DPS) common to automatic test equipment (ATE) and other instrumentation. Its small size, high level of integration, and superb flexibility make the MAX32010 ideal and economical for multisite systems requiring many device power supplies. The MAX32010 has multiple input control voltages that allow independent setting of the output voltage and voltage/current limits. The MAX32010 is a voltage source when the load current is between the two programmed limits, and it transitions gracefully into a precision current source/sink if a programmed current limit is reached. The output features two independently adjustable voltage clamps that limit both the negative and positive output voltage. The MAX32010 can source voltages spanning 25V and can source currents as high as ±1200mA. The DPS can support an external buffer for sourcing and sinking higher currents. Multiple MAX32010s can be configured in parallel to load-share, allowing higher output currents with greater flexibility. The MAX32010 features operation over a wide range of load conditions. Programmability allows optimizing of settling time, over-/ undershoot, and stability. Configurable range-change glitch control circuit minimizes output transients during range transitions. The MAX32010 offers load regulation of 1mV at 1200mA load and is available in a 100-pin TQFP package with an exposed pad on the top for heat removal. Applications • Memory Testers • VLSI Testers • System-on-a-Chip Testers • Industrial Systems • Programmable Power Supplies Benefits and Features • Programmability for Multiple ATE Applications • Programmable Current and Voltage Compliance • Programmable Current Ranges - ±200µA - ±2mA - ±20mA - ±1200mA • External Buffer Supports Higher Currents with up to 16 Parallel Devices • Programmable Gain Allows a Wide Range of DACs • High Accuracy and Flexible Control for Optimal Performance • Load Regulation of 1mV at 1200mA • Programmable Compensation for Wide Range of Loads • Range Change Glitch Control • Integrated Window Comparator for Go/No-Go Testing • External Test Mode Enables IDDQ Measurement with Reprogramming • 3-Wire, 20MHz SPI Interface • Integrated Protection for Robustness • Thermal Warning Flag and Thermal Shutdown • Short-Circuit Protection • Compact 14mm x 14mm, 100-Pin TQFP Package Ordering Information appears at end of data sheet. |
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