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4AM17 Datasheet(PDF) 4 Page - Hitachi Semiconductor |
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4AM17 Datasheet(HTML) 4 Page - Hitachi Semiconductor |
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4 / 7 page ![]() 4AM17 4 ( P Channel ) Item Symbol Min Typ Max Unit Test Conditions Drain to source breakdown voltage V (BR)DSS –60 — — V I D = –10 mA, VGS = 0 Gate to source breakdown voltage V (BR)GSS ±20 ——V I G = ±100 µA, VDS = 0 Gate to source leak current I GSS —— ±10 µAV GS = ±16 V, VDS = 0 Zero gate voltage drain current I DSS — — –250 µAV DS = –50 V, VGS = 0 Gate to source cutoff voltage V GS(off) –1.0 — –2.5 V V DS = –10 V, I D = –1 mA Static drain to source on state R DS(on) — 0.15 0.2 Ω I D = –4 A, VGS = –10 V Note3 resistance R DS(on) — 0.2 0.27 Ω I D = –4 A, VGS = –4 V Note3 Forward transfer admittance |y fs| 3.5 6.0 — S I D = –4 A, VDS = –10 V Note3 Input capacitance Ciss — 17 — pF V DS = –10 V Output capacitance Coss — 460 — pF V GS = 0 Reverse transfer capacitance Crss — 1.2 — pF f = 1 MHz Gate series resistance Rg — 3.2 — k Ω V DS = 0, VGS = 0 f = 1 MHz Turn-on delay time t d(on) — 0.6 — ns V GS = –10 V, ID = –4 A Rise time t r — 2.1 — ns R L = 7.5 Ω Turn-off delay time t d(off) —12 — ns Fall time t f — 5.8 — ns Body–drain diode forward voltage V DF — –1.2 — V I F = –8 A, VGS = 0 Body–drain diode reverse recovery time t rr — 2.5 — ns I F = –8 A, VGS = 0 diF/ dt = 50 A/ µs Note: 3. Pulse test |
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