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SPC58ECX Datasheet(PDF) 24 Page - STMicroelectronics |
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SPC58ECX Datasheet(HTML) 24 Page - STMicroelectronics |
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24 / 153 page ![]() Electrical characteristics SPC584Cx, SPC58ECx 24/153 DS11620 Rev 8 IDDSTBY8 CC D Total standby mode current on VDD_LV and VDD_HV supply, 8 KB RAM(11) TJ = 25 °C — 85 160 µA CTJ = 40 °C — — 250 DTJ = 55 °C — — 370 DTJ = 120 °C — 1.2 2.2 mA PTJ = 150 °C — 2.9 5.0 IDDSTBY32 CC D Total standby mode current on VDD_LV and VDD_HV supply, 32 KB RAM(11) TJ = 25 °C — 100 180 µA CTJ = 40 °C — — 270 DTJ = 55 °C — — 410 DTJ = 120 °C — — 2.4 mA PTJ = 150 °C — — 5.5 IDDSTBY256 CC D Total standby mode current on VDD_LV and VDD_HV supply, 256 KB RAM(11) TJ = 25 °C — 150 250 µA CTJ = 40 °C — — 390 DTJ = 55 °C — — 590 DTJ = 120 °C — 2.0 3.5 mA PTJ = 150 °C — 5.1 8 IDDSSWU1 CC D SSWU running over all STANDBY period with OPC/TU commands execution and keeping ADC off(12) TJ =40 °C — 1.0 3.5 mA IDDSSWU2 CC D SSWU running over all STANDBY period with OPC/TU/ADC commands execution and keeping ADC on(13) TJ =40 °C — 3.5 5.0 mA 1. The ranges in this table are design targets and actual data may vary in the given range. 2. The leakage considered is the sum of core logic and RAM memories. The contribution of analog modules is not considered, and they are computed in the dynamic IDD_LV and IDD_HV parameters. 3. IDD_LKG (leakage current) and IDD_LV (dynamic current) are reported as separate parameters, to give an indication of the consumption contributors. The tests used in validation, characterization and production are verifying that the total consumption (leakage+dynamic) is lower or equal to the sum of the maximum values provided (IDD_LKG +IDD_LV). The two parameters, measured separately, may exceed the maximum reported for each, depending on the operative conditions and the software profile used. 4. Use case: 2 x e200Z4 @180 MHz, HSM @90 MHz, all IPs clock enabled, Flash access with prefetch disabled, Flash consumption includes parallel read and program/erase, all SARADC in continuous conversion, DMA continuously triggered by ADC conversion, 4 DSPI / 8 CAN / 2 LINFlex and 2 DSPI transmitting, 2 x EMIOS running (8 channels in OPWMT mode), FIRC, SIRC, FXOSC, PLL0-1 running. The switching activity estimated for dynamic consumption does not include I/O toggling, which is highly dependent on the application. Details of the software configuration are available separately. The total device consumption is IDD_LV + IDD_HV + IDD_LKG for the selected temperature. 5. Gateway use case: Two cores running at 160 MHz, DMA, PLL, FLASH read only 25%, 8xCAN, 1xEthernet, HSM, 2xSARADC. 6. BCM use case: One Core running at 160 MHz, no lockstep no, DMA, PLL, FLASH read only 25%, 2xCAN, HSM, 4xSARADC. Table 9. Device consumption (continued) Symbol C Parameter Conditions Value(1) Unit Min Typ Max |
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