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LTM4658EVPBF Datasheet(PDF) 15 Page - Analog Devices |
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LTM4658EVPBF Datasheet(HTML) 15 Page - Analog Devices |
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15 / 26 page ![]() LTM4658 15 Rev. 0 For more information www.analog.com 3. θJCtop, the thermal resistance from junction to top of the product case, is determined with nearly all of the component power dissipation flowing through the top of the package. As the electrical connections of the typical µModule are on the bottom of the package, it is rare for an application to operate such that most of the heat flows from the junction to the top of the part. As in the case of θJCbottom, this value may be useful for comparing packages but the test conditions don’t generally match the user’s application. A graphical representation of the aforementioned ther- mal resistances is given in Figure 5; blue resistances are contained within the µModule regulator, whereas green resistances are external to the µModule. As a practical matter, it should be clear to the reader that no individual or sub-group of the four thermal resistance parameters defined by JESD51-12 or provided in the Pin Configuration section replicates or conveys normal op- erating conditions of a μModule. For example, in normal board-mounted applications, never does 100% of the device’s total power loss (heat) thermally conduct exclu- sively through the top or exclusively through bottom of the µModule—asthestandarddefinesforθJCtopandθJCbottom, respectively.Inpractice,powerlossisthermallydissipated in both directions away from the package—granted, in the absence of a heat sink and airflow, a majority of the heat flow is into the board. Within a SIP (system-in-package) module, be aware there are multiple power devices and components dissipating power, with a consequence that the thermal resistances relative to different junctions of components or die are not exactly linear with respect to total package power loss. To reconcile this complication without sacrificing modeling simplicity—but also, not ignoring practical realities—an approach has been taken using FEA software modeling along with laboratory testing in a controlled-environment chamber to reasonably define and correlate the thermal resistance values supplied in this data sheet: (1) Initially, FEA software is used to accurately build the mechanical geometry of the µModule and the specified PCB with all of the correct material coefficients along with accurate power loss source definitions; (2) this model simulates a software-defined JEDEC environment consistent with JESD51-9 to predict power loss heat flow and temperature readingsatdifferentinterfacesthatenablethecalculationof theJEDEC-definedthermalresistancevalues;(3)themodel and FEA software is used to evaluate the µModule with heat sink and airflow; (4) having solved for and analyzed these thermal resistance values and simulated various operating conditions in the software model, a thorough laboratory evaluation replicates the simulated conditions with thermocouples within a controlled-environment chamber while operating the device at the same power loss as that which was simulated. An outcome of this process and due-diligence yields a set of derating curves provided in other sections of this data sheet. APPLICATIONS INFORMATION 4658 F05 µModule DEVICE θJCtop JUNCTION-TO-CASE (TOP) RESISTANCE θJA JUNCTION-TO-AMBIENT RESISTANCE CASE (TOP)-TO-AMBIENT RESISTANCE BOARD-TO-AMBIENT RESISTANCE θJCbot JUNCTION-TO-CASE (BOTTOM) RESISTANCE JUNCTION AMBIENT CASE (BOTTOM)-TO-BOARD RESISTANCE Figure 5. Graphical Representation of JESD51-12 Thermal Coefficients |
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