Rev Date: 9/12/2022

3

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This specification may be changed at any time without prior notice.

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Please confirm technical specifications before you order and/or use.

HCSK Series

Kelvin Termination Metal Element Current Shunt Resistor

Stackpole Electronics, Inc.

Resistive Product Solutions

Power Derating Curve:

Environmental Performance Characteristics

Test

Test Method

Test Specification

Test Condition

Short Time Overload

-

Δ R: ± 1%

5 times rated power for 5 seconds

+20°C/+125ºC

+25°C/+125ºC

Operating Temperature Range is - 55°C to + 170°C

Temperature Coefficient

of Resistance (TCR)

(1216, 4026)

JIS-C5202-5.2

Refer to

Electrical

Specifications

The chip (mounted on board) is exposed in the heat chamber,

125ºC for 1000 hours.

High Temperature

Exposure

Moisture Resistance

JIS-C5202-7.2

Δ R: ± 1%

Δ R: ± 1%

MIL-STD-202,

Method 106

The specimens shall be placed in a chamber and subjected to a relative

humidity of 90 ~ 98% and a temperature of 25ºC/65ºC, 10 cycles.

Temperature Coefficient

of Resistance (TCR)

(2725)

JIS-C5202-5.2

Refer to

Electrical

Specifications

Note: The terminal electron temperature of component should be below 100°C.

Storage Conditions: Temperature of 22 ~ 28°C. Humidity: 40 ~ 75%.

Apply rated power for 1000 hours with 1.5 hours ON and 0.5 hour OFF.

Load Life

The chip (mounted on board) is exposed,

-55 ± 3ºC (30 minutes)/+125 ± 2ºC (30 minutes) for 5 cycles.

The following conditions shown in the figure below.

Rapid Change of

Temperature

JIS-C5202-7.10

JIS-C5202-7.4

Δ R: ± 1%

Δ R: ± 1%

Δ R

R x Δ t

TCR (ppm/ºC ) =

x 10

6

Δ R

R x Δ t

TCR (ppm/ºC ) =

x 10

6