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STF33N60DM6 Datasheet(PDF) 4 Page - STMicroelectronics |
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STF33N60DM6 Datasheet(HTML) 4 Page - STMicroelectronics |
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4 / 12 page ![]() Table 7. Source drain diode Symbol Parameter Test conditions Min. Typ. Max. Unit ISD Source-drain current - 25 A ISDM(1) Source-drain current (pulsed) - 80 A VSD(2) Forward on voltage VGS = 0 V, ISD = 25 A - 1.6 V trr Reverse recovery time ISD = 25 A, di/dt = 100 A/µs, VDD = 60 V (see Figure 15. Test circuit for inductive load switching and diode recovery times) - 105 ns Qrr Reverse recovery charge - 0.47 µC IRRM Reverse recovery current - 9 A trr Reverse recovery time ISD = 25 A, di/dt = 100 A/µs, VDD = 60 V, Tj = 150 °C (see Figure 15. Test circuit for inductive load switching and diode recovery times) - 210 ns Qrr Reverse recovery charge - 1.68 µC IRRM Reverse recovery current - 16 A 1. Pulse width is limited by safe operating area. 2. Pulsed: pulse duration = 300 µs, duty cycle 1.5 %. STF33N60DM6 Electrical characteristics DS12937 - Rev 2 page 4/12 |
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