Figure 9. Relative variation of critical rate of decrease of

main current versus junction temperature

(dI/dt) [T ] / (dI/dt) [T =125 °C]

c

c

j

j

0.0

0.5

1.0

1.5

2.0

2.5

25

35

45

55

65

75

85

95

105

115

125

T (°C)

j

Figure 10. Relative variation of static dV/dt immunity

versus junction temperature (typical values above 5

kV/µs)

dV/dt [ Tj] / dV/dt [ Tj=125°C]

0

1

2

3

4

5

25

50

75

100

125

VD=VR=536V

Tj(°C)

Figure 11. Relative variation of leakage current versus

junction temperature

1.0E-03

1.0E-02

1.0E-01

1.0E+00

25

50

75

100

125

IDRM/IRRM [Tj;V DRM/VRRM]/IDRM/IRRM [Tj=125°C;800 V]

VDRM=VRRM=600 V

VDRM=VRRM=800 V

Tj(°C)

Figure 12. Relative variation of critical rate of decrease of

main current (di/dt)c versus (dV/dt)c

(dI/dt)c [ (dV/dt) c ] / Specified(dI/dt)c

0.0

0.5

1.0

1.5

2.0

2.5

3.0

3.5

4.0

4.5

5.0

0.1

1.0

10.0

100.0

Tj =125 °C

(dV/dt) c (V/µs)

ACS108-8SA

Characteristics (curves)

DS12901 - Rev 1

page 6/13