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TA1318AF Datasheet(PDF) 21 Page - Toshiba Semiconductor |
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TA1318AF Datasheet(HTML) 21 Page - Toshiba Semiconductor |
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21 / 42 page ![]() TA1318AF 2003-02-19 21 Characteristics Symbol Test Circuit Test Condition Min Typ. Max Unit Delayed HD pulse width Wd-HD (Note HA09) 1.0 1.2 1.4 µs V13TH0 4.5 5.0 5.5 V13TL0 0.1 0.5 V13TH1 4.5 5.0 5.5 V13TL1 0.1 0.5 V13TH2 4.5 5.0 5.5 V13TL2 0.1 0.5 V13TH3 4.5 5.0 5.5 HD1 output voltage V13TL3 0.1 0.5 V V15TH0 4.5 5.0 5.5 V15TL0 0.1 0.5 V15TH1 4.5 5.0 5.5 V15TL1 0.1 0.5 V15TH2 4.5 5.0 5.5 V15TL2 0.1 0.5 V15TH3 4.5 5.0 5.5 HD2 output voltage V15TL3 0.1 0.5 V V13IH0 4.5 5.0 5.5 V13IL0 0.1 0.5 V13IH1 4.5 5.0 5.5 V13IL1 0.1 0.5 V13IH2 4.5 5.0 5.5 V13IL2 0.1 0.5 V13IH3 4.5 5.0 5.5 HD1 output voltage (polarity inverse) V13IL3 0.1 0.5 V V15IH0 4.5 5.0 5.5 V15IL0 0.1 0.5 V15IH1 4.5 5.0 5.5 V15IL1 0.1 0.5 V15IH2 4.5 5.0 5.5 V15IL2 0.1 0.5 V15IH3 4.5 5.0 5.5 HD2 output voltage (polarity inverse) V15IL3 0.1 0.5 V ID1 310 385 460 ID2 310 385 460 ID3 520 650 780 AFC phase detection current ID4 (Note HB01) 520 650 780 µA VCO oscillation start voltage VVCO (Note HB02) 3.9 4.2 4.5 V TH00 1.4 1.8 2.2 TH01 1.4 1.8 2.2 TH10 1.4 1.8 2.2 HD output pulse width (free-run) TH11 (Note HB03) 1.4 1.8 2.2 µs |
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