74F132 datasheet(4/8 Pages) PHILIPS

4 / 8 page

Philips Semiconductors

Product specification

74F132

Quad 2-input NAND Schmitt trigger

1991 Jun 26

DC ELECTRICAL CHARACTERISTICS

(Over recommended operating free-air temperature range unless otherwise noted.)

SYMBOL

PARAMETER

TEST CONDITIONS1

LIMITS

UNIT

SYMBOL

PARAMETER

TEST CONDITIONS1

MIN

TYP2

MAX

UNIT

VT+

Positive-going threshold

VCC = 5.0V

1.5

1.7

2.0

VT–

Negative-going threshold–

VCC = 5.0V

0.7

0.9

1.1

nVT

Hysteresis (VT+ – VT–)

VCC = 5.0V

0.4

0.8

High level output voltage

VCC = MIN,

±10%VCC

2.5

VOH

High-level output voltage

VI=VT–MAX, IOH = MAX

±5%VCC

2.7

3.4

Low level output voltage

VCC = MIN,

±10%VCC

0.30

0.50

VOL

Low-level output voltage

VI=VT+MAX, IOL = MAX

±5%VCC

0.30

0.50

VIK

Input clamp voltage

VCC = MIN, II = IIK

–0.73

–1.2

IT+

Input current at positive-going threshold

VCC = 5.0V, VI=VT+

µA

IT–

Input current at negative-going threshold

VCC = 5.0V, VI=VT–

–350

µA

Input current at maximum input voltage

VCC = MAX, VI = 7.0V

100

µA

IIH

High-level input current

VCC = MAX, VI = 2.7V

µA

IIL

Low-level input current

VCC = MAX, VI = 0.5V

–0.6

IOS

Short-circuit output current3

VCC = MAX

–60

–150

ICC

Supply current (total)

ICCH

VCC = MAX

VI N= GND

8.5

12.0

ICC

Supply current (total)

ICCL

VCC = MAX

VIN = 4.5V

13.0

19.5

NOTES:

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.

2. All typical values are at VCC = 5V, Tamb = 25°C.

3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold

techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting

of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any

sequence of parameter tests, IOS tests should be performed last.

74F132 Datasheet(PDF) 4 Page - NXP Semiconductors

74F132 Datasheet(HTML) 4 Page - NXP Semiconductors

Html Pages

1 2 3 4 5 6 7 8

Datasheet Download

Link URL