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74F241 Datasheet(PDF) 6 Page - NXP Semiconductors |
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74F241 Datasheet(HTML) 6 Page - NXP Semiconductors |
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6 / 12 page ![]() Philips Semiconductors Product specification 74F240/74F240A/ 74F241/74F241A Buffers January 2, 1991 6 DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST LIMITS UNIT CONDITIONS1 MIN TYP2 MAX VCC = MIN, IOH = –3mA ±10%VC C 2.4 V VOH High-level output voltage VIL = MAX, ±5%VCC 2.7 3.4 V VIH = MIN IOH = –15mA ±10%VC C 2.0 V ±5%VCC 2.0 V VOL Low-level output voltage VCC = MIN, VIL = MAX, IOL = MAX ±10%VC C 0.50 V VIH = MIN, ±5%VCC 0.42 0.50 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 -1.2 V II Input current at maximum input voltage VCC = MAX, VI = 7.0V 100 µA IIH High–level input current VCC = MAX, VI = 2.7V 20 µA 74F240 all inputs –1.0 mA 74F240A all inputs –100 µA IIL Low–level input current 74F241 OEa, OEb VCC = MAX, VI = 0.5V –1.0 mA 74F241 Ian, Ibn –1.6 mA 74F241A all inputs –40 µA IOZH Off–state output current, high–level voltage applied VCC = MAX, VO = 2.7V 50 µA IOZL Off–state output current, low–level voltage applied VCC = MAX, VO = 0.5V –50 µA IOS Short–circuit output current3 VCC = MAX -100 -225 mA ICCH 12 18 mA 74F240 ICCL 50 70 mA ICCZ VCC = MAX 35 45 mA ICCH 28 37 mA 74F240A ICCL 58 75 mA ICC Supply current (total) ICCZ 34 50 mA ICCH 40 60 mA 74F241 ICCL 60 90 mA ICCZ VCC = MAX 65 90 mA ICCH 20 30 mA 74F241A ICCL 49 65 mA ICCZ 26 40 mA Notes to DC electrical characteristics 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. |
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