74F533 datasheet(6/12 Pages) PHILIPS

6 / 12 page

Philips Semiconductors

Product specification

74F533,* 74F534

Latch/flip-flop

1999 Jan 08

* Discontinued part. Please see the Discontinued Products List.

DC ELECTRICAL CHARACTERISTICS

(Over recommended operating free-air temperature range unless otherwise noted.)

SYMBOL

PARAMETER

TEST CONDITIONS1

LIMITS

UNIT

SYMBOL

PARAMETER

TEST CONDITIONS1

MIN

TYP2

MAX

UNIT

High level output voltage

VCC = MIN, VIL = MAX,

±10%VCC

2.4

VOH

High-level output voltage

VCC

MIN, VIL

MAX,

VIH = MIN, IOH = MAX

±5%VCC

2.7

3.3

Low level output voltage

VCC = MIN, VIL = MAX,

±10%VCC

0.35

0.50

VOL

Low-level output voltage

VCC

MIN, VIL

MAX,

VIH = MIN, IOL = MAX

±5%VCC

0.35

0.50

VIK

Input clamp voltage

VCC = MIN, II = IIK

–0.73

–1.2

Input current at

maximum input voltage

VCC = MAX, VI = 7.0V

100

µA

IIH

High-level input current

VCC = MAX, VI = 2.7V

µA

IIL

Low-level input current

VCC = MAX, VI = 0.5V

–0.6

IOZH

Off-state output current,

High-level voltage applied

VCC = MAX, VO = 2.7V

µA

IOZL

Off-state output current,

Low-level voltage applied

VCC = MAX, VO = 0.5V

–50

µA

IOS

Short-circuit output current3

VCC = MAX

–60

–150

ICC

Supply current (total)

74F533

VCC = MAX

OE=4.5V, Dn=E=GND

ICC

Supply current (total)

74F534

VCC = MAX

OE=4.5V, Dn=GND

NOTES:

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.

2. All typical values are at VCC = 5V, Tamb = 25°C.

3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold

techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting

of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any

sequence of parameter tests, IOS tests should be performed last.

AC ELECTRICAL CHARACTERISTICS

LIMITS

SYMBOL

PARAMETER

TEST

CONDITIONS

Tamb= +25°C

VCC = +5V

CL = 50pF, RL = 500Ω

Tamb = 0°C to +70°C

VCC = +5V ± 10%

CL = 50pF, RL = 500Ω

UNIT

MIN

TYP

MAX

MIN

MAX

tPLH

tPHL

Propagation delay

Dn to Qn

Waveform 2

4.0

3.0

6.0

4.5

8.5

7.0

4.0

3.0

9.5

8.0

tPLH

tPHL

Propagation delay

E to Qn

74F533

Waveform 3

5.0

3.0

6.5

4.5

9.5

7.0

5.0

3.0

10.0

8.0

tPZH

tPZL

Output Enable time

to High or Low level

74F533

Waveform 6

Waveform 7

2.0

4.5

5.0

7.0

2.0

8.0

tPHZ

tPLZ

Output Disable time

from High or Low level

Waveform 6

Waveform 7

2.0

3.5

3.0

6.0

5.5

2.0

7.0

6.5

fMAX

Maximum Clock frequency

Waveform 1

150

165

135

MHz

tPLH

tPHL

Propagation delay

CP to Qn

Waveform 1

3.0

4.5

7.0

2.5

7.5

tPZH

tPZL

Output Enable time

to High or Low level

74F534

Waveform 6

Waveform 7

2.0

4.5

5.0

7.5

2.0

8.5

tPHZ

tPLZ

Output Disable time

from High or Low level

Waveform 6

Waveform 7

2.0

3.5

6.5

5.5

2.0

7.5

6.5

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