| Electronic Components Datasheet Search |
|
BAQ800 Datasheet(PDF) 8 Page - NXP Semiconductors |
|
|
|||||||||||||||||||||||||||||
BAQ800 Datasheet(HTML) 8 Page - NXP Semiconductors |
|
8 / 12 page ![]() 1997 Aug 26 8 Philips Semiconductors Product specification AM PIN diode BAQ800 Fig.15 Charge carrier life time test circuit and definition. Input impedance of oscilloscope: 1 M Ω, 22 pF; tr ≤ 7 ns. Source impedance: 50 Ω; tr ≤ 15 ns. handbook, full pagewidth MGG506 10 Ω 10 µF 10 mA DUT τ 6 0 10 I F (mA) 10% t 90% I R (mA) pulse f = 1 kHz Fig.16 Diode forward resistance test circuit. IF (mA) R1 ( Ω) R2 (kΩ) 0.1 3000 100 1 300 10 10 30 1 handbook, halfpage MGG507 R1 R2 IF 50 Ω 50 Ω 1 µF Vin Vout 100 kHz 11 V DUT Fig.17 Device mounted on a printed-circuit board. Dimensions in mm. handbook, halfpage MGA200 3 2 7 50 25 50 |
|
|
Link URL |
| Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Contact us | Privacy Policy | Link to Datasheet | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |