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BF511 Datasheet(PDF) 3 Page - NXP Semiconductors |
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BF511 Datasheet(HTML) 3 Page - NXP Semiconductors |
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3 / 7 page ![]() December 1997 3 Philips Semiconductors Product specification N-channel silicon field-effect transistors BF510 to 513 RATINGS Limiting values in accordance with the Absolute Maximum System (IEC 134) THERMAL RESISTANCE Note 1. Mounted on a ceramic substrate of 8 mm × 10 mm × 0.7 mm. STATIC CHARACTERISTICS Tamb =25 °C Drain-source voltage VDS max. 20 V Drain-gate voltage (open source) VDGO max. 20 V Drain current (DC or average) ID max. 30 mA Gate current ± I G max. 10 mA Total power dissipation up to Tamb =40 °C (note 1) Ptot max. 250 mW Storage temperature range Tstg −65 to + 150 °C Junction temperature Tj max. 150 °C From junction to ambient (note 1) Rth j-a = 430 K/W BF510 511 512 513 Gate cut-off current −VGS = 0.2 V; VDS =0 −IGSS < 10 10 10 10 nA Gate-drain breakdown voltage IS =0; −ID =10 µA −V(BR)GDO > 20 20 20 20 V Drain current > < 0.7 3.0 2.5 7.0 6 12 10 18 mA mA VDS = 10 V; VGS =0 IDSS Gate-source cut-off voltage ID =10 µA; VDS = 10 V −V(P)GS typ. 0.8 1.5 2.2 3 V |
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