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5B34 Datasheet(PDF) 4 Page - Analog Devices |
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5B34 Datasheet(HTML) 4 Page - Analog Devices |
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4 / 8 page ![]() 5B34 Rev. 0 | Page 4 of 8 Output Rise Time, 10% to 90% Span 200 ms Common-Mode Voltage (CMV) Input-to-Output, Continuous 1500 V rms, maximum Output-to-Power, Continuous4 ±3 V, maximum Transient ANSI/IEEE C37.90.1-1989 Common Mode Rejection (CMR) 1 k Ω Source Imbalance, 50/60 Hz 160 dB Normal Mode Rejection 50/60 Hz 60 dB Sensor Excitation Current 100 Ω Pt, 120Ω Ni 0.25 mA 10 Ω Cu 1.0 mA Lead Resistance Effect 100 Ω Pt, 120Ω Ni ±0.02°C/ Ω 10 Ω Cu ±0.2°C/ Ω Input Protection Continuous 240 V rms, maximum Transient ANSI/IEEE C37.90.1-1989 Output Resistance 50 Ω Voltage Output Protection Continuous Short to Ground Output Selection Time 6 µs @ Cload = 0 to 2,000 pF Output Enable Control Max Logic "0" +1 V Min Logic "1" +2.5 V Max Logic "1" +36 V Input Current "0" 0.4 mA Power Supply Voltage +5 V ±5% Power Supply Current 30 mA Power Supply Sensitivity, RTI 100 Ω Pt, 120Ω Ni ±0.05°C/V 10 Ω Cu ±0.5°C/V Mechanical Dimensions 2.275" x 2.375" x 0.595" (57.8 mm x 59.1 mm x 15.1 mm) Environmental Rated Performance -25°C to +85°C Operating -40°C to +85°C Storage -40°C to +85°C Relative Humidity 0 to 93% @ +40°C non-condensing RFI Susceptibility ±0.5% Span error @ 400 MHz, 5 Watt, 3 ft * ±0.025 Ω For Cu RTD's; ±0.1Ω For Ni RTD's. 1 Rz is the value of the RTD resistance at the lowest point of the measurement range. 2 Includes the combined effects of repeatability, hysteresis, and conformity error. Loads heavier than 50 k Ω will degrade conformity and gain temperature coefficient. 3 For Pt RTD's only; other types may vary. 4 The output common must be kept within ±3 V of power common. Specifications subject to change without notice. |
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