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6000E Datasheet(PDF) 2 Page - Pico Technology Ltd.

Part # 6000E
Description  Smarter scopes for faster debug
PDF  39 Pages
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Manufacturer  PICO [Pico Technology Ltd.]
Direct Link  https://www.picotech.com/
Logo PICO - Pico Technology Ltd.

6000E Datasheet(HTML) 2 Page - Pico Technology Ltd.

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PicoScope® 6000E Series
Product overview
The PicoScope 6000E Series fixed-resolution and FlexRes oscilloscopes provide 8 to 12 bits of vertical resolution, with up to 1 GHz bandwidth and 5 GS/s sampling rate. Models
with four or eight analog channels have the timing and amplitude resolution you need to reveal critical signal integrity issues such as timing errors, glitches, dropouts, crosstalk and
metastability issues.
Typical applications
These oscilloscopes are ideal for design engineers working with high-performance embedded systems, signal processing, power electronics, mechatronics and automotive designs,
and for researchers and scientists working on multi-channel high-performance experiments in physics labs, particle accelerators and similar facilities.
Best-in-class bandwidth, sampling rate and memory depth
Capture time in PicoScope 6 at maximum sampling rate: 200 ms at 5 GS/s
With up to 1 GHz analog bandwidth
complemented by a real-time sampling rate of
5 GS/s, the PicoScope 6000E Series scopes
can display single-shot pulses with 200 ps time
resolution.
The PicoScope 6000E Series gives you the
deepest capture memory available as standard on
any oscilloscope – up to 4 GS in total.
This ultra-deep memory allows the oscilloscope
to capture 200 ms waveforms at its maximum
sampling rate of 5 GS/s.
Custom applications using PicoSDK can allocate
the scope’s whole memory to a single waveform
and sustain the maximum 5 GS/s sampling rate
for even longer captures, up to an incredible
800 ms.
The SuperSpeed USB 3.0 interface and hardware
acceleration ensure that the display is smooth
and responsive even with long captures.
The PicoScope 6000E Series gives you the
waveform memory, resolution and analysis tools
that you need to perform stringent testing of
today’s high-performance embedded computers
and next-generation embedded system designs.



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