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ADP3118JRZ Datasheet(PDF) 10 Page - Analog Devices

Part # ADP3118JRZ
Description  Dual Bootstrapped 12 V MOSFET Driver with Output Disable
PDF  16 Pages
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Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
Logo AD - Analog Devices

ADP3118JRZ Datasheet(HTML) 10 Page - Analog Devices

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ADP3118
Rev. 0 | Page 10 of 16
APPLICATION INFORMATION
SUPPLY CAPACITOR SELECTION
For the supply input (VCC) of the ADP3118, a local bypass
capacitor is recommended to reduce the noise and to supply
some of the peak currents drawn. Use a 4.7 µF, low ESR
capacitor. Multilayer ceramic chip (MLCC) capacitors provide
the best combination of low ESR and small size. Keep the
ceramic capacitor as close as possible to the ADP3118.
BOOTSTRAP CIRCUIT
The bootstrap circuit uses a charge storage capacitor (CBST)
and a diode, as shown in Figure 1. These components can be
selected after the high-side MOSFET is chosen. The bootstrap
capacitor must have a voltage rating that can handle twice the
maximum supply voltage. A minimum 50 V rating is
recommended. The capacitor values are determined by:
GATE
GATE
BST2
BST1
V
Q
C
C
×
=
+
10
(1)
D
CC
GATE
BST2
BST1
BST1
V
V
V
C
C
C
−
=
+
(2)
where:
QGATE is the total gate charge of the high-side MOSFET at VGATE.
VGATE is the desired gate drive voltage (usually in the range of 5 V
to 10 V, 7 V being typical).
VD is the voltage drop across D1.
Rearranging Equations 1 and 2 to solve for CBST1 yields
D
CC
GATE
BST1
V
V
Q
C
−
×
= 10
CBST2 can then be found by rearranging Equation 1
1
10
BST
GATE
GATE
BST2
C
V
Q
C
−
×
=
For example, an NTD60N02 has a total gate charge of about
12 nC at VGATE = 7 V. Using VCC = 12 V and VD = 1 V, one finds
CBST1 = 12 nF and CBST2 = 6.8 nF. Good quality ceramic capacitors
should be used.
RBST is used for slew-rate limiting to minimize the ringing at the
switch node. It also provides peak current limiting through D1.
An RBST value of 1.5 Ω to 2.2 Ω is a good choice. The resistor
needs to be able to handle at least 250 mW due to the peak
currents that flow through it.
A small-signal diode can be used for the bootstrap diode due
to the ample gate drive voltage supplied by VCC. The bootstrap
diode must have a minimum 15 V rating to withstand the
maximum supply voltage. The average forward current can
be estimated by
MAX
GATE
AVG
F
f
Q
I
×
=
)
(
(3)
where
fMAX is the maximum switching frequency of the
controller. The peak surge current rating should be calculated
using
BST
D
CC
PEAK
F
R
V
V
I
−
=
)
(
(4)
MOSFET SELECTION
When interfacing the ADP3118 to external MOSFETs, there are
a few considerations that the designer should be aware of. These
help to make a more robust design that minimizes stresses on
both the driver and the MOSFETs. These stresses include
exceeding the short-time duration voltage ratings on the driver
pins as well as the external MOSFET.
It is also highly recommended to use the Boot-Snap circuit to
improve the interaction of the driver with the characteristics of
the MOSFETs. If a simple bootstrap arrangement is used, make
sure to include a proper snubber network on the SW node.
HIGH-SIDE (CONTROL) MOSFETS
The high-side MOSFET is usually selected to be high speed to
minimize switching losses (see the ADP3186 or ADP3188 data
sheet for Flex-Mode controller details). This usually implies a
low gate resistance and low input capacitance/charge device.
Yet, a significant source lead inductance can also exist. This
depends mainly on the MOSFET package; it is best to contact
the MOSFET vendor for this information.
The ADP3118 DRVH output impedance and the input resistance
of the MOSFETs determine the rate of charge delivery to the
gate’s internal capacitance. This determines the speed at which
the MOSFETs turn on and off. However, due to potentially large
currents flowing in the MOSFETs at the on and off times (this
current is usually larger at turn off due to ramping up of the out-
put current in the output inductor), the source lead inductance
generates a significant voltage when the high-side MOSFETs
switch off. This creates a significant drain-source voltage spike
across the internal die of the MOSFETs and can lead to a
catastrophic avalanche. The mechanisms involved in this
avalanche condition can be referenced in literature from the
MOSFET suppliers.



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