Philips Semiconductors

Product specification

FBL2041

FBL2041I

3.3V BTL 7-bit Futurebus+ transceiver (standard A-port)

1999 Apr 27

3

PIN CONFIGURATION

52 51 50 49 48 47 46

45 44 43 42 41 40

39

38

37

36

35

34

33

32

31

30

29

28

27

1

2

3

4

5

6

7

8

9

10

11

12

13

14 15 16 17 18 19

20

21 22 23 24 25 26

BUS GND

B1

BUS GND

B2

BUS GND

B3

BUS GND

B4

BUS GND

B5

BUS GND

B6

N/C

LOGIC GND

AI1

AI2

AO2

LOGIC GND

AO3

LOGIC GND

AI3

AI4

AO4

LOGIC GND

AO5

LOGIC GND

7-Bit Transceiver

52-lead PQFP

SG00115

PIN DESCRIPTION

SYMBOL

PIN NUMBER

TYPE

NAME AND FUNCTION

AI0 – AI6

51, 2, 3, 8, 9, 14, 18

Input

Data inputs (TTL)

AO0 – AO6

50, 52, 4, 6, 10, 12, 16

Output

3-State outputs (TTL)

B0 – B6

40, 38, 36, 34, 32, 30, 28

I/O

Data inputs/Open Collector outputs, High current drive (BTL)

OEB0

46

Input

Enables the Bn outputs when High

OEB1

45

Input

Enables the B0 output when Low

OEB2

25

Input

Enables the B1 – B3 outputs when Low

OEB3

26

Input

Enables the B4 – B6 outputs when Low

OEA1

47

Input

Enables the A0 outputs when High

OEA2

20

Input

Enables the A1 – A3 outputs when High

OEA3

24

Input

Enables the A4 – A6 outputs when High

BUS GND

41, 39, 37, 35, 33, 31, 29

GND

Bus ground (0V)

LOGIC GND

1, 5, 7, 11, 13, 15, 19

GND

Logic ground (0V)

23, 43

Power

Positive supply voltage

17, 49

Power

Positive supply voltage BAND GAP

BIAS V

48

Power

Positive supply voltage

TMS

42

Input

Test Mode Select (no-connect)

TCK

44

Input

Test Clock (no-connect)

TDI

22

Input

Test Data In (shorted to TDO)

TDO

21

Output

Test Data Out (TDI)

N/C

27

—

Not connected