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MAX20044F Datasheet(PDF) 13 Page - Analog Devices |
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MAX20044F Datasheet(HTML) 13 Page - Analog Devices |
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13 / 16 page ![]() EN Input EN is an active-low enable input. Drive EN low for normal operation and enable the protection switches. This allows BUS power, D+, and D- USB signaling to pass through the device if a fault is not present. Drive EN high to dis- able the device. The MAX20042F, MAX20043F, and MAX20044F devices support USB OTG. With these units, disabling the device through the EN pin disables the +5V BUS power switch, but leaves the D+ and D- data switches closed. This allows for a downstream device to assume the role of host when nego- tiated per the USB Host Negotiation Protocol. In this mode, the HVBUS, HVD+, and HVD- outputs continue to be pro- tected and FAULT continues to assert normally in response to overvoltage conditions on these pins. Applications Information Power-Supply Bypass Capacitor Bypass HVBUS to GND with a 10µF and a 0.1µF ceramic capacitor as close to the device as possible to provide ±15kV (HBM) ESD protection on the pin. If the power source has significant inductance due to long lead length, take care to prevent overshoots due to the LC tank circuit and provide protection if necessary to prevent violation of the +6V absolute maximum rating on BUS. Connect a 100µF low-ESR ceramic capacitor from BUS to GND. Connect a 0.1µF and 10µF ceramic capacitor from both BUS and IN to GND. Place these components on the same plane as the IC, close to the IN and GND pins. Layout of USB Data Line Traces USB Hi-Speed requires careful PCB layout with 90Ω controlled-impedance matched traces of equal lengths. Use LC tuning components on the data lines as shown in the Typical Operating Circuit. The values of these com- ponents are layout and captive-cable dependent. Contact Analog Devices technical support for more detailed infor- mation. ±15kV ESD Protection As with all Analog Devices ICs, ESD-protection structures are incorporated on all pins to protect against electrostatic discharges encountered during handling and assembly. The devices have extra protection against static electric- ity. Analog Devices engineers have developed state-of- the-art structures to protect against ESD of ±15kV at the HVD+, HVD-, and HVBUS ports without damage. The ESD structures withstand high ESD in all states: normal operation, shutdown, and powered down. After an ESD event, the devices keep working without latchup, whereas other solutions can latch and must be powered down to remove latchup. ESD protection can be tested in various ways; this product is characterized for protection to the following limits: ● ±15kV using the Human Body Model ● ±15kV using IEC 61000-4-2’s Air-Gap Discharge method, EN = GND ● ±8kV using the Contact Discharge method specified in IEC 61000-4-2, EN = GND ESD Test Conditions ESD performance depends on a variety of conditions. Contact Analog Devices for a reliability report that docu- ments test setup, test methodology, and test results. Human Body Model Figure 8 shows the Human Body Model, and Figure 9 shows the current waveform it generates when discharged into a low impedance. This model consists of a 100pF capacitor charged to the ESD voltage of interest, which is then discharged into the device through a 1.5kΩ resistor. IEC 61000-4-2 The IEC 61000-4-2 standard covers ESD testing and performance of finished equipment. The MAX20042F, MAX20043F, and MAX20044F devices help users design equipment that meets Level 4 of IEC 61000-4-2. The main difference between tests done using the Human Body Model and IEC 61000-4-2 is higher peak current in IEC 61000-4-2. Because series resistance is lower in the IEC 61000-4-2 ESD test model (Figure 10), the ESD withstand voltage measured to this standard is generally lower than that measured using the Human Body Model. Figure 11 shows the current waveform for the ±8kV, IEC 61000-4-2 Level 4, ESD Contact Discharge test. The Air-Gap Discharge test involves approaching the device with a charged probe. The Contact Discharge method connects the probe to the device before the probe is energized. www.analog.com Analog Devices │ 13 MAX20042F–MAX20044F Automotive Hi-Speed USB 2.0 Protectors |
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