| Electronic Components Datasheet Search |
|
PI3042A Datasheet(PDF) 7 Page - AMI SEMICONDUCTOR |
|
|
|||||||||||||||||||||||||||||
PI3042A Datasheet(HTML) 7 Page - AMI SEMICONDUCTOR |
|
7 / 18 page ![]() Second Setup: The CIS modules made with these devices operate in excess of 5.0 MHz. Accordingly the wafer probe specifications are supplemented with high frequency clocking performance using an A6 length modules PCB board. Electro-Optical Characteristics (25o C) The electro-optical characteristics of PI3042A imaging sensor chip are listed in Table 2. This is the wafer probe specification used to tests the each die at 25o C. Parameters Symbols Typical Units Notes Number of Photo-elements 128 elements Pixel-to-pixel spacing ~62.5 µm Line scanning rate Tint (1) 128/Fclk µs/line Clock frequency Fclk (2) 500 KHz See note 2 for higher clock speed. (maximum 5 MHz) Output voltage Vpavg (3) 1.8 ± 0.35 V Output voltage non-uniformity Up (4) 7.5 % Dark output voltage Vd (5) <100 mV Dark output non-uniformity Ud (6) <100 mV Adjacent Pixel non-uniformity Upadj (7) <7.5 % Chip-to-chip non-uniformity Ucc (8) 7.5 % Table 2. Electro-Optical Characteristic Notes: (1) Tint stands for the line scanning rate or the integration time. It is determined by the time interval between two start pulses, where the start pulses start the line-scan process, as soon as, CP, module clock, acquires it and shifts it into the internal shift register. The minimum integration time in a scan is determined by the number of pixels in the scan divided by the clock frequency. In a CIS module it is the number of sensors times the number of pixel in the sensor, all over the clock frequency. This time is especially set for the wafer prober in order to calibrate the Vpavg, see note (3). (2) Fclk is the device’s clock, CP, frequency and it is, also, equal to the pixel rate. In the wafer test Fclk is set to 500 KHz. However, PIC (recently acquired by AMIS) has been successfully mass-producing high frequency CIS modules, using only the wafer test to qualify them. Hence, the device, tested on an A6 size module’s PCB board at their standard high speed, is specified. (3) Vpavg = Vp(n)/Npixels (average level in one line scan). Where Vp(n) is the amplitude of nth pixel in the sensor chip and Npixels is the total number of pixels in sensor chip. Vpavg is converted from impulse current video pixel into a voltage output. See Figure 4, Video Pixel Output Structure in section Output Circuit Of The Image Sensor and Figure 5, Video Output Test and Application Circuit in section Signal Conversion Circuit on page 6 and 7. Vpavg is calibrated for each image sensor type because of probe card variations, as well as, the interfacing circuits to the wafer probe machine. Preliminary PI3042A datasheet Page 7 of18 Date: 09/23/05 |
|
|
Link URL |
| Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Contact us | Privacy Policy | Link to Datasheet | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |