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PI3042A Datasheet(PDF) 7 Page - AMI SEMICONDUCTOR

Part # PI3042A
Description  Contact Image Sensor Chip
PDF  18 Pages
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Manufacturer  AMI [AMI SEMICONDUCTOR]
Direct Link  http://www.amis.com
Logo AMI - AMI SEMICONDUCTOR

PI3042A Datasheet(HTML) 7 Page - AMI SEMICONDUCTOR

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Second Setup: The CIS modules made with these devices operate in excess of 5.0 MHz.
Accordingly the wafer probe specifications are supplemented with high frequency clocking
performance using an A6 length modules PCB board.
Electro-Optical Characteristics (25o C)
The electro-optical characteristics of PI3042A imaging sensor chip are listed in Table 2. This is
the wafer probe specification used to tests the each die at 25o C.
Parameters
Symbols
Typical
Units
Notes
Number of Photo-elements
128
elements
Pixel-to-pixel spacing
~62.5
µm
Line scanning rate
Tint (1)
128/Fclk
µs/line
Clock frequency
Fclk (2)
500
KHz
See note 2 for higher
clock speed.
(maximum 5 MHz)
Output voltage
Vpavg (3)
1.8 ± 0.35
V
Output voltage non-uniformity
Up (4)
7.5
%
Dark output voltage
Vd (5)
<100
mV
Dark output non-uniformity
Ud (6)
<100
mV
Adjacent Pixel non-uniformity
Upadj (7)
<7.5
%
Chip-to-chip non-uniformity
Ucc (8)
7.5
%
Table 2. Electro-Optical Characteristic
Notes: (1)
Tint stands for the line scanning rate or the integration time. It is
determined by the time interval between two start pulses, where the start
pulses start the line-scan process, as soon as, CP, module clock, acquires
it and shifts it into the internal shift register. The minimum integration time
in a scan is determined by the number of pixels in the scan divided by the
clock frequency. In a CIS module it is the number of sensors times the
number of pixel in the sensor, all over the clock frequency. This time is
especially set for the wafer prober in order to calibrate the Vpavg, see
note (3).
(2)
Fclk is the device’s clock, CP, frequency and it is, also, equal to the pixel
rate. In the wafer test Fclk is set to 500 KHz. However, PIC (recently
acquired by AMIS) has been successfully mass-producing high frequency
CIS modules, using only the wafer test to qualify them. Hence, the device,
tested on an A6 size module’s PCB board at their standard high speed, is
specified.
(3)
Vpavg = Vp(n)/Npixels (average level in one line scan).
Where Vp(n) is the amplitude of nth pixel in the sensor chip and
Npixels is the total number of pixels in sensor chip. Vpavg is converted from
impulse current video pixel into a voltage output. See Figure 4, Video Pixel
Output Structure in section Output Circuit Of The Image Sensor and Figure 5,
Video Output Test and Application Circuit in section Signal Conversion Circuit on
page 6 and 7. Vpavg is calibrated for each image sensor type because of probe
card variations, as well as, the interfacing circuits to the wafer probe machine.
Preliminary PI3042A datasheet
Page 7 of18 Date: 09/23/05



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