TC341

780×488 PIXEL

CCD IMAGE SENSOR

SOCS083A – OCTOBER 2002

10

POST OFFICE BOX 655303

MIN

TYP

MAX

UNIT

Sensitivity (Note 7)

No IR filter

413

mV/Lx

With IR filter

51

VOFF

Zero input offset (Note 8)

0

100

200

mV

Blooming overload ratio (Note 9)

500:1

Image area well capacity with antiblooming off

70k

80k

00k

Image area well capacity with antiblooming on

35k

40k

45k

Smear (Note 10)

–75

dB

Dark current (Note 11)

TA = 21°C

0.1

nA/cm2

Dark signal (Note 12)

TA = 21°C

0.06

mV

Dark-signal uniformity (Note 13)

TA = 21°C

0.03

mV

Dark-signal shading (Note 14)

TA = 21°C

0.03

mV

Spurious nonuniformity

Dark (Note 15)

TA = 21°C

3.5

mV

Illuminated lens F#8

TA = 21°C

15

%

Column uniformity (Note 16)

TA = 21°C

0.3

mV

Electronic-shutter capability

1/1000

1/30

sec

NOTES:

7. Light source temperature is 2856

°K. The IR filter used is CM500 1mm thick. Integration time is 1/30 sec.

8. This is a signal pedestal measured from the output level after reset to the output level after the SRG negative transition without any

light input into the sensor.

9. Blooming is the condition in which charge induced by light in one element spills over to the neighboring elements.

10. Smear is the measure of error signal introduced into the pixels by transferring them through the illuminated region into the memory.

The illuminated region is 1/10 of the image area height. The value in the table is obtained for the integration time of 33.33 ms and

8 MHz vertical clock transfer frequency.

11. Dark current depends on temperature and approximately doubles every 8

°C.

12. Dark signal is actual device output measured in dark.

13. Dark signal uniformity is the sigma of difference of two neighboring pixels taken from all the image area pixels.

14. Dark signal shading is the difference between maximum and minimum of 5 pixel median taken anywhere in the array.

15. Spurious non-uniformity is the signal of no more than three neighboring pixels that exceeds or is less than average.

16. Column uniformity is obtain by summing all the lines in the array, finding the maximum of the difference of two neighboring columns

anywhere in the array, and dividing the result by number of lines.

pixel defect specifications, integration time = 1/60 sec, temperature = 40

°C

DEVICE PART

NUMBER

DEVICE IN DARK

DEVICE ILLUMINATED

TOTAL

DEFECT

COUNT

DEFECT COUNT

NUMBER

WS

BS

WS/BS

DEFECT

COUNT

NUMBER

WS

SIGNAL OUTPUT

LEVEL

AREA

AREA

AREA

AREA

A

B

A

B

A

B

A

B

TC341-20

> 3.5 mV

0

0

0

0

0

0

> 5%

0

0

50 mV

+/– 10 mV

0

TC341-30

2.5~3.5 mV

2

5

2

5

2

2

5~7.5%

2

5

12

> 3.5 mV

0

0

0

0

0

0

> 7.5%

0

0

TC341-40

3.5~7 mV

3

7

3

7

3

7

7.5~15%

3

7

15

> 7 mV

0

0

0

0

0

0

> 15%

0

0

17. See Figure 3 for definitions of area A and area B.