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HT1620 Datasheet(PDF) 4 Page - Holtek Semiconductor Inc |
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HT1620 Datasheet(HTML) 4 Page - Holtek Semiconductor Inc |
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4 / 14 page ![]() Pad Description Pad No. Pad Name I/O Description 51, 1 CC1, CC2 I External capacitor pin, for double voltage and half voltage circuit use 2 VO15N O Half voltage circuit output pin 3 VEE ¾ Double voltage circuit output pin 4~7 COM0~COM3 O LCD common outputs 8~39 SEG0~SEG31 O LCD segment outputs 40 CS I Chip selection input with pull-high resistor. When the CS is logic high, the data and command, read from or written to the HT1620 are disabled. The serial interface circuit is also reset. But if the CS is at logic low level and is input to the CS pad, the data and command transmis- sion between the host controller and the HT1620 are all enabled. 41 RD I READ clock input with pull-high resistor. Data in the RAM of the HT1620 are clocked out on the falling edge of the RD signal. The clocked out data will appear on the DATA line. The host controller can use the next raising edge to latch the clocked out data. 42 WR I WRITE clock input with pull-high resistor. Data on the DATA line are latched into the HT1620 on the rising edge of the WR signal. 43 DATA I/O Serial data input/output with pull-high resistor 44 VSS ¾ Negative power supply, Ground 45 OSCO O The OSCI and OSCO pads are connected to a 32.768kHz crystal in order to generate a system clock. 46 OSCI I 47 VDD ¾ Positive power supply 48 IRQ O Time base or WDT overflow flag, NMOS open drain output 49, 50 BZ, BZ O 2kHz or 4kHz tone frequency output pair (tri-state output buffer) Absolute Maximum Ratings Supply Voltage ...........................VSS -0.3V to VSS+3.6V Storage Temperature ............................ -50oCto125oC Input Voltage..............................VSS -0.3V to VDD+0.3V Operating Temperature........................... -25oCto75oC Note: These are stress ratings only. Stresses exceeding the range specified under ²Absolute Maximum Ratings² may cause substantial damage to the device. Functional operation of this device at other conditions beyond those listed in the specification is not implied and prolonged exposure to extreme conditions may affect device reliabil- ity. HT1620 Rev. 1.30 4 March 27, 2007 |
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