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N Transistor Bare Die, MMBTA28

NP

Absolute Maximum Ratings T

A = 25°C unless otherwise stated

Rev 1.0

07/07/17

PARAMETER

SYMBOL

VALUE

UNIT

Collector-Base Voltage

VCBO

80

V

Collector-Emitter Voltage

VCEO

80

V

Emitter-Base Voltage

VEBO

12

V

Collector Current

IC

800

mA

Junction Temperature

TJ

150

°C

Storage Temperature

Tstg

-55 to 150

°C

PARAMETER

SYMBOL

CONDITIONS

MIN

TYP

MAX

UNIT

OFF CHARACTERISTICS

Collector-Base Breakdown Voltage

V(BR)CBO

IC = 100µA, IE = 0

80

-

-

V

Collector-Emitter Breakdown Voltage

V(BR)CEO

IC = 100µA, IB = 0

80

-

-

V

Emitter-Base Breakdown Voltage

V(BR)EBO

IE = 10µA, IC = 0

12

-

-

V

ICBO

VCB = 60V, IE = 0

-

-

100

nA

Collector Cut-off Current

ICES

VCE = 60V, IE = 0

-

-

500

nA

Emitter Cut-off Current

IEBO

VEB = 10V, IC = 0

-

-

100

nA

ON CHARACTERISTICS

1

VCE = 5V, IC = 10mA

10000

-

-

-

Forward-Current Transfer Ratio

hFE

VCE = 5V, IC = 100mA

10000

-

-

-

IC = 10mA, IB = 0.01mA

-

-

1.2

V

Collector-Emitter Saturation Voltage

VCE(sat)

IC = 100mA, IB = 0.1mA

-

-

1.5

V

Base-Emitter On Voltage

VBE(on)

IC = 100mA, VCE = 5V

-

-

2.0

V

SMALL SIGNAL CHARACTERISTICS

2

Transition Frequency

fT

IC = 15mA, VCE = 5V, f = 100MHz

125

-

-

MHz

Output Capacitance

Cobo

VCB = 10V, IE = 0, f = 1MHz

-

-

8

pF

Electrical Characteristics T

A = 25°C unless otherwise stated

1. Pulse Test: Pulse Width ≤ 300µs, Duty Cycle ≤ 2% 2. Not production testing in die form, characterized by chip design and tested

in package

DISCLAIMER: The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics. With

respect to any examples or hints given herein, any typical values stated herein and/or any information regarding the application of the device, Silicon

Supplies Ltd hereby disclaims any and all warranties and liabilities of any kind.

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approval of Silicon Supplies Ltd, if a failure of such components can reasonably be expected to cause the failure of that life support device or

system or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human

body or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other

persons may be endangered.