SN54AC00-DIE

www.ti.com

SCHS391A – APRIL 2013 – REVISED NOVEMBER 2013

RAD-TOLERANT, QUADRUPLE 2-INPUT POSITIVE-NAND GATE

Check for Samples: SN54AC00-DIE

1

FEATURES

•

2-V to 6-V VCC Operation

•

Inputs Accept Voltages to 6 V

•

Max tpd of 7 ns at 5 V

DESCRIPTION/ORDERING INFORMATION

The SN54AC00-DIE device contains four independent 2-input NAND gates. Each gate performs the Boolean

function of Y = A • B or Y = A + B in positive logic.

ORDERING INFORMATION(1)

PACKAGE

PRODUCT

PACKAGE

ORDERABLE PART NUMBER

PACKAGE QUANTITY

DESIGNATOR

SN54AC00VTD1

100

SN54AC00

TD

Bare die in waffle pack(2)

SN54AC00VTD2

10

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI

web site at www.ti.com.

(2)

Processing is per the Texas Instruments space production baseline and is in compliance with the Texas Instruments Quality Control

System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room temperature

only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not warranted. Visual

Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.

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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

PRODUCTION DATA information is current as of publication date.

Copyright © 2013, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

On products compliant to MIL-PRF-38535, all parameters are

Instruments standard warranty. Production processing does not

tested unless otherwise noted. On all other products, production

necessarily include testing of all parameters.

processing does not necessarily include testing of all parameters.