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MAX1887EEE Datasheet(PDF) 4 Page - Maxim Integrated Products

Part # MAX1887EEE
Description  120 SAN GABRIEL DR. SUNNYVALE, CA 94086
PDF  8 Pages
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Manufacturer  MAXIM [Maxim Integrated Products]
Direct Link  https://www.maximintegrated.com/en.html
Logo MAXIM - Maxim Integrated Products

MAX1887EEE Datasheet(HTML) 4 Page - Maxim Integrated Products

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V. Quality Assurance Information
A. Quality Assurance Contacts:
Jim Pedicord (Reliability Lab Manager
Bryan Preeshl (Executive Director of QA)
Kenneth Huening (Vice President)
B. Outgoing Inspection Level:
0.1% for all electrical parameters guaranteed by the Datasheet.
0.1% For all Visual Defects.
C. Observed Outgoing Defect Rate: < 50 ppm
D. Sampling Plan: Mil-Std-105D
VI. Reliability Evaluation
A. Accelerated Life Test
The results of the 135
°C biased (static) life test are shown in Table 1. Using these results, the Failure
Rate (
λ) is calculated as follows:
λ =
1
=
1.83
(Chi square value for MTTF upper limit)
MTTF
192 x 4389 x 80 x 2
Temperature Acceleration factor assuming an activation energy of 0.8eV
λ = 13.57 x 10-9
λ = 13.57 F.I.T. (60% confidence level @ 25°C)
This low failure rate represents data collected from Maxim’s reliability qualification and monitor programs.
Maxim also performs weekly Burn-In on samples from production to assure reliability of its processes.
The
reliability required for lots which receive a burn-in qualification is 59 F.I.T. at a 60% confidence level, which equates
to 3 failures in an 80 piece sample. Maxim performs failure analysis on rejects from lots exceeding this level. The
attached Burn-In Schematic (Spec. # 06-5881) shows the static circuit used for this test. Maxim also performs
1000 hour life test monitors quarterly for each process. This data is published in the Product Reliability Report (RR-
1M).
B. Moisture Resistance Tests
Maxim evaluates pressure pot stress from every assembly process during qualification of each new design.
Pressure Pot testing must pass a 20% LTPD for acceptance.
Additionally, industry standard 85
°C/85%RH or
HAST tests are performed quarterly per device/package family.
C. E.S.D. and Latch-Up Testing
The PD13 die type has been found to have all pins able to withstand a transient pulse of
±2000V, per Mil-
Std-883 Method 3015 (reference attached ESD Test Circuit).
Latch-Up testing has shown that this device
withstands a current of
±250mA.



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