TPS54233-Q1

SLUSAZ7A – MARCH 2012 – REVISED MARCH 2012

www.ti.com

These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam

during storage or handling to prevent electrostatic damage to the MOS gates.

DESCRIPTION CONTINUED

For additional design needs, see:

TPS54231-Q1

TPS54232-Q1

TPS54331-Q1

TPS54332-Q1

TPS54233-Q1

(Preview)

(Preview)

(Preview)

(Preview)

IO(Max)

2A

2A

2A

3A

3.5A

Input Voltage Range

3.5V - 28V

3.5V - 28V

3.5V - 28V

3.5V - 28V

3.5V - 28V

Switching Freq. (Typ)

570kHz

1000kHz

285kHz

570kHz

1000kHz

Switch Current Limit (Min)

2.3A

2.3A

2.3A

3.5A

4.2A

Pin/Package

8SOIC

8SOIC

8SOIC

8SOIC

8SO PowerPAD™

ORDERING INFORMATION(1)

TA

PACKAGE

SWITCHING FREQUENCY

PART NUMBER(2)

–40°C to +125°C

8 pin SOIC

300 kHz

TPS54233QDRQ1

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI

web site at www.ti.com.

(2)

See applications section of data sheet for layout information.

ABSOLUTE MAXIMUM RATINGS

(1)

over operating free-air temperature range (unless otherwise noted)

VALUE

UNIT

MIN

MAX

VIN

–0.3

30

EN

–0.3

6

BOOT

38

Input Voltage

V

VSENSE

–0.3

3

COMP

–0.3

3

SS

–0.3

3

BOOT-PH

8

Output Voltage

PH

–0.6

30

V

PH (10 ns transient from ground to negative peak)

–5

EN

100

μA

BOOT

100

mA

Source Current

VSENSE

10

μA

PH

6

A

VIN

6

A

Sink Current

COMP

100

μA

SS

200

Human body model (HBM) AEC-Q100 Classification Level H2

2

kV

Electrostatic Discharge

Charged device model (CDM) AEC-Q100 Classification Level C3B

750

V

Operating Junction Temperature

–40

+150

°C

Storage Temperature

–65

+150

°C

(1)

Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating

conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

2

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