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DAC5672MPFBREP Datasheet(PDF) 1 Page - Texas Instruments

Part # DAC5672MPFBREP
Description  DUAL 14-BIT 200-MSPS DIGITAL-TO-ANALOG CONVERTER
PDF  30 Pages
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Manufacturer  TI2 [Texas Instruments]
Direct Link  https://www.ti.com
Logo TI2 - Texas Instruments

DAC5672MPFBREP Datasheet(HTML) 1 Page - Texas Instruments

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FEATURES
APPLICATIONS
DESCRIPTION
DAC5672-EP
SGLS339A – JUNE 2006 – REVISED OCTOBER 2006
DUAL 14-BIT 200-MSPS DIGITAL-TO-ANALOG CONVERTER
•
WCDMA Adjacent Channel Leakage Ratio
(ACLR): 78 dB at Baseband
•
Controlled Baseline
•
WCDMA ACLR: 73 dB at 30.72 MHz
– One Assembly
•
Independent or Single Resistor Gain Control
– One Test Site
•
Dual or Interleaved Data
– One Fabrication Site
•
On-Chip 1.2-V Reference
•
Extended Temperature Performance of
–55
°C to 125°C
•
Low Power: 330 mW
•
Enhanced Diminishing Manufacturing
•
Power-Down Mode: 9 mW
Sources (DMS) Support
•
Package: 48-Pin Thin-Quad Flat Pack (TQFP)
•
Enhanced Product-Change Notification
•
Qualification Pedigree (1)
•
Cellular Base Transceiver Station Transmit
•
14-Bit Dual Transmit Digital-to-Analog
Channel
Converter (DAC)
– CDMA: W-CDMA, CDMA2000, IS-95
•
200-MSPS Update Rate
– TDMA: GSM, IS-136, EDGE/UWC-136
•
Single Supply: 3 V to 3.6 V
•
Medical/Test Instrumentation
•
High Spurious-Free Dynamic Range (SFDR):
•
Arbitrary Waveform Generators (ARB)
84 dBc at 5 MHz
•
Direct Digital Synthesis (DDS)
•
High Third-Order Two-Tone Intermodulation
•
Cable Modem Termination System (CMTS)
(IMD3): 79 dBc at 15.1 MHz and 16.1 MHz
(1)
Component qualification in accordance with JEDEC and
industry standards to ensure reliable operation over an
extended temperature range. This includes, but is not limited
to, Highly Accelerated Stress Test (HAST) or biased 85/85,
temperature cycle, autoclave or unbiased HAST,
electromigration, bond intermetallic life, and mold compound
life. Such qualification testing should not be viewed as
justifying use of this component beyond specified
performance and environmental limits.
The DAC5672 is a monolithic, dual-channel, 14-bit, high-speed digital-to-analog converter (DAC) with on-chip
voltage reference.
Operating with update rates of up to 200 MSPS, the DAC5672 offers exceptional dynamic performance, tight
gain, and offset matching characteristics that make it suitable in either I/Q baseband or direct IF communication
applications.
Each DAC has a high-impedance, differential-current output, suitable for single-ended or differential
analog-output configurations. External resistors allow scaling the full-scale output current for each DAC
separately or together, typically between 2 mA and 20 mA. An accurate on-chip voltage reference is temperature
compensated and delivers a stable 1.2-V reference voltage. Optionally, an external reference may be used.
The DAC5672 has two 14-bit parallel input ports with separate clocks and data latches. For flexibility, the
DAC5672 also supports multiplexed data for each DAC on one port when operating in the interleaved mode.
The DAC5672 has been specifically designed for a differential transformer-coupled output with a 50-
Ω
doubly-terminated load. For a 20-mA full-scale output current, both a 4:1 impedance ratio (resulting in an output
power of 4 dBm) and 1:1 impedance ratio transformer (–2 dBm output power) are supported.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Copyright © 2006, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.


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