ADC081S051

SNAS309F – APRIL 2005 – REVISED JANUARY 2014

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ADC081S051 Timing Specifications

The following specifications apply for VA = +2.7V to 5.25V, GND = 0V, fSCLK = 4 MHz to 10 MHz, CL = 25 pF,

fSAMPLE = 200 ksps to 500 ksps, Boldface limits apply for TA = TMIN to TMAX: all other limits TA = 25°C.

Symbol

Parameter

Conditions

Typical

Limits

Units

tCS

Minimum CS Pulse Width

10

ns (min)

tSU

CS to SCLK Setup Time

10

ns (min)

tEN

Delay from CS Until SDATA TRI-STATE Disabled(1)

20

ns (max)

VA = +2.7V to +3.6V

40

ns (max)

tACC

Data Access Time after SCLK Falling Edge(2)

VA = +4.75V to +5.25V

20

ns (max)

tCL

SCLK Low Pulse Width

0.4 x tSCLK

ns (min)

tCH

SCLK High Pulse Width

0.4 x tSCLK

ns (min)

VA = +2.7V to +3.6V

7

ns (min)

tH

SCLK to Data Valid Hold Time

VA = +4.75V to +5.25V

5

ns (min)

25

ns (max)

VA = +2.7V to +3.6V

6

ns (min)

tDIS

SCLK Falling Edge to SDATA High Impedance(3)

25

ns (max)

VA = +4.75V to +5.25V

5

ns (min)

tPOWER-

Power-Up Time from Full Power-Down

1

µs

UP

(1)

Measured with the timing test circuit shown in Figure 2 and defined as the time taken by the output signal to cross 1.0V.

(2)

Measured with the timing test circuit shown in Figure 2 and defined as the time taken by the output signal to cross 1.0V or 2.0V.

(3)

tDIS is derived from the time taken by the output to change by 0.5V with the timing test circuit shown in Figure 2. The measured number

is then adjusted to remove the effects of charging or discharging the load capacitance. This means that tDIS is the true bus relinquish

time, independent of the bus loading.

6

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