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LP5907 Datasheet(PDF) 6 Page - Texas Instruments |
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LP5907 Datasheet(HTML) 6 Page - Texas Instruments |
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6 / 34 page ![]() 6 LP5907-Q1 SNVSA34E – SEPTEMBER 2014 – REVISED DECEMBER 2019 www.ti.com Product Folder Links: LP5907-Q1 Submit Documentation Feedback Copyright © 2014–2019, Texas Instruments Incorporated (1) All voltages are with respect to the device GND terminal, unless otherwise stated. (2) Minimum and maximum limits are ensured through test, design, or statistical correlation over the junction temperature (TJ) range of –40°C to 125°C, unless otherwise stated. Typical values represent the most likely parametric norm at TA = 25°C, and are provided for reference purposes only. (3) In applications where high power dissipation and/or poor package thermal resistance is present, the maximum ambient temperature may have to be derated. Maximum ambient temperature (TA-MAX) is dependent on the maximum operating junction temperature (TJ-MAX-OP = 125°C), the maximum power dissipation of the device in the application (PD-MAX), and the junction-to ambient thermal resistance of the part/package in the application RθJA), as given by the following equation: TA-MAX = TJ-MAX-OP – (RθJA × PD-MAX). See Application and Implementation. (4) Quiescent current is defined here as the difference in current between the input voltage source and the load at VOUT. (5) Ground current is defined here as the total current flowing to ground as a result of all input voltages applied to the device. (6) Dropout voltage is the voltage difference between the input and the output at which the output voltage drops to 100 mV below its nominal value. (7) Short-circuit current (ISC) for the LP5907-Q1 is equivalent to current limit. To minimize thermal effects during testing, ISC is measured with VOUT pulled to 100 mV below its nominal voltage. (8) This specification is verified by design. (9) There is a 1-MΩ resistor between EN and ground on the device. 6.5 Electrical Characteristics VIN = VOUT(NOM) + 1 V, VEN = 1.2 V, IOUT = 1 mA, CIN = 1 µF, COUT = 1 µF (unless otherwise noted) (1) (2) (3) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT GENERAL VIN Input voltage TA = 25°C 2.2 5.5 V ΔVOUT Output voltage tolerance VIN = (VOUT(NOM) + 1 V) to 5.5 V, IOUT = 1 mA to 250 mA SOT-23 package VOUT ≥ 1.8 V –2 2 %VOUT VOUT < 1.8 V –3 3 VIN = (VOUT(NOM) + 1 V) to 5.5 V, IOUT = 1 mA to 250 mA X2SON package VOUT > 2.5 V –2 2 VOUT ≤ 2.5 V –3 3 Line regulation VIN = (VOUT(NOM) + 1 V) to 5.5 V, IOUT = 1 mA 0.02 %/V Load regulation IOUT = 1 mA to 250 mA 0.001 %/mA ILOAD Output load current 0 250 mA IQ Quiescent current(4) VEN = 1.2 V, IOUT = 0 mA 12 25 µA VEN = 1.2 V, IOUT = 250 mA 250 425 VEN = 0.3 V (Disabled) 0.2 1 IG Ground current(5) VEN = 1.2 V, IOUT = 0 mA 14 µA VDO Dropout voltage(6) IOUT = 100 mA 50 mV IOUT = 250 mA 250 ISC Short-circuit current limit TA = 25°C (7) 250 500 mA PSRR Power-supply rejection ratio(8) f = 100 Hz, IOUT = 20 mA 90 dB f = 1 kHz, IOUT = 20 mA 82 f = 10 kHz, IOUT = 20 mA 65 f = 100 kHz, IOUT = 20 mA 60 eN Output noise voltage(8) BW = 10 Hz to 100 kHz IOUT = 1 mA 10 µVRMS IOUT = 250 mA 6.5 RAD Output automatic discharge pulldown resistance VEN < VIL (output disabled) 230 Ω TSD Thermal shutdown TJ rising 160 °C Thermal hysteresis TJ falling from shutdown 15 LOGIC INPUT THRESHOLDS VIL Low input threshold VIN = 2.2 V to 5.5 V, VEN falling until the output is disabled 0.4 V VIH High input threshold VIN = 2.2 V to 5.5 V, VEN rising until the output is enabled 1.2 V IEN Input current at EN pin(9) VEN = 5.5 V and VIN = 5.5 V 5.5 µA VEN = 0 V and VIN = 5.5 V 0.001 |
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