ADS805

2

SBAS073B

www.ti.com

+VS ....................................................................................................... +6V

Analog Input ............................................................. –0.3V to (+VS) + 0.3V

Logic Input ............................................................... –0.3V to (+VS) + 0.3V

Case Temperature ......................................................................... +100

°C

Junction Temperature .................................................................... +150

°C

Storage Temperature ..................................................................... +150

°C

ABSOLUTE MAXIMUM RATINGS(1)

ELECTROSTATIC

DISCHARGE SENSITIVITY

This integrated circuit can be damaged by ESD. Texas Instru-

ments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling

and installation procedures can cause damage.

ESD damage can range from subtle performance degradation

to complete device failure. Precision integrated circuits may be

more susceptible to damage because very small parametric

changes could cause the device not to meet its published

specifications.

ADS805E

PARAMETER

CONDITIONS

MIN

TYP

MAX

UNITS

RESOLUTION

12 Bits Tested

SPECIFIED TEMPERATURE RANGE

–40 to +85

°C

CONVERSION CHARACTERISTICS

Sample Rate

10k

20M

Samples/s

Data Latency

6

Clk Cycles

ANALOG INPUT

Standard Single-Ended Input Range

1.5

3.5

V

Optional Single-Ended Input Range

0

5

V

Standard Common-Mode Voltage

2.5

V

Standard Optional Common-Mode Voltage

1

V

Input Capacitance

20

pF

Analog Input Bandwidth

–3dBFS Input

270

MHz

DYNAMIC CHARACTERISTICS

Differential Linearity Error (Largest Code Error)

f = 500kHz

±0.25

±0.75

LSB

No Missing Codes

Tested

Spurious-Free Dynamic Range(1)

f = 9.8MHz

65

74

dBFS(2)

2-Tone Intermodulation Distortion(3)

f = 7.7MHz and 7.9MHz (–7dB each tone)

–70

dBc

Signal-to-Noise Ratio (SNR)

f = 9.8MHz

63

68

dBFS

Signal-to-(Noise + Distortion) (SINAD)

f = 9.8MHz

62

66

dBFS

Effective Number of Bits at 9.8MHz(4)

10.7

Bits

Input Referred Noise

0V to 5V Input

0.09

LSBs rms

1.5V to 3.5V Input

0.23

LSBs rms

Integral Nonlinearity Error

f = 500kHz

±1

±2LSB

Aperture Delay Time

3ns

Aperture Jitter

4

ps rms

Over-Voltage Recovery Time

1.5x FS Input

2

ns

Full-Scale Step Acquisition Time

20

ns

ELECTRICAL CHARACTERISTICS

At TA = full specified temperature range, VS = +5V, specified input range = 1.5V to 3.5V, and single-ended input and sampling rate = 20MHz, unless otherwise specified.

NOTES: (1) Spurious-Free Dynamic Range refers to the magnitude of the largest harmonic. (2) dBFS means dB relative to full-scale. (3) 2-tone intermodulation

distortion is referred to the largest fundamental tone. This number will be 6dB higher if it is referred to the magnitude of the 2-tone fundamental envelope. (4) Effective

number of bits (ENOB) is defined by (SINAD – 1.76)/6.02. (5) Internal 50k

Ω pull-down resistor. (6) Includes internal reference. (7) Excludes internal reference.

SPECIFIED

PACKAGE

TEMPERATURE

PACKAGE

ORDERING

TRANSPORT

PRODUCT

PACKAGE-LEAD

DESIGNATOR(1)

RANGE

MARKING

NUMBER(2)

MEDIA, QUANTITY

ADS805

SSOP-28

DB

–40

°C to +85°C

ADS805E

ADS805E

Rails, 48

"

"""

"

ADS805E/1K

Tape and Reel, 1000

NOTE: (1) For the most current specifications and package information, refer to our web site at www.ti.com.

PACKAGE/ORDERING INFORMATION

NOTE: (1) Stresses above those listed under “Absolute Maximum Ratings”

may cause permanent damage to the device. Exposure to absolute maximum

conditions for extended periods may affect device reliability.