Electronic Components Datasheet Search
  English  ▼

X  

AL1783Q Datasheet(PDF) 3 Page - Diodes Incorporated

Part # AL1783Q
Description  55V THREE-CHANNEL PWM LINEAR LED DRIVER
PDF  14 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
Manufacturer  DIODES [Diodes Incorporated]
Direct Link  http://www.diodes.com
Logo DIODES - Diodes Incorporated

AL1783Q Datasheet(HTML) 3 Page - Diodes Incorporated

  AL1783Q Datasheet HTML 1Page - Diodes Incorporated AL1783Q Datasheet HTML 2Page - Diodes Incorporated AL1783Q Datasheet HTML 3Page - Diodes Incorporated AL1783Q Datasheet HTML 4Page - Diodes Incorporated AL1783Q Datasheet HTML 5Page - Diodes Incorporated AL1783Q Datasheet HTML 6Page - Diodes Incorporated AL1783Q Datasheet HTML 7Page - Diodes Incorporated AL1783Q Datasheet HTML 8Page - Diodes Incorporated AL1783Q Datasheet HTML 9Page - Diodes Incorporated Next Button
Zoom Inzoom in Zoom Outzoom out
 3 / 14 page
background image
AL1783Q
Document number: DS46208 Rev. 1 - 2
3 of 14
www.diodes.com
January 2024
© 2024 Copyright Diodes Incorporated. All Rights Reserved.
AL1783Q
Functional Block Diagram
Pre_regulator
Bandgap
Bias current
UVLO
OSC
VREF
Dimming Signal
Process
REF1
PWM1
PWM2
PWM3
VIN
LED1
LED2
LED3
GND
VDD
Current Reference
Current Ratio
Circuit
PWM Control
Current Ratio
Circuit
PWM Control
Current Ratio
Circuit
PWM Control
REF2
Current Reference
REF3
Current Reference
Thermal
Foldback
Protection Function
FAULTB
Figure 2. Functional Block Diagram
Absolute Maximum Ratings (Note 4)
Symbol
Parameter
Ratings
Units
VVIN
Input Voltage Relative to GND
-0.3 to 62
V
VLED1,2,3
LED1,2,3 Voltage Relative to GND
-0.3 to 62
V
ILED1,2,3
LED1,2,3 Output Current
300
mA
VPWM1,2,3, VREF1,2,3,
VFAULTB
PWM1,2,3, REF1,2,3, and FAULT Voltage Relative to GND
-0.3 to 7
V
TJ
Operating Junction Temperature
-40 to +150
°C
TST
Storage Temperature
-55 to +160
°C
Note:
4. Stresses greater than Absolute Maximum Ratings specified above can cause permanent damage to the device. These are stress ratings only;
functional operation of the device at these or any other conditions exceeding those indicated in this specification is not implied. Device reliability can be
affected by exposure to absolute maximum rating conditions for extended periods of time.
Semiconductor devices are ESD sensitive and can be damaged by exposure to ESD events. Suitable ESD precautions should be taken when handling
and transporting these devices.
ESD Ratings
Symbol
Parameter
Rating
Unit
VESD
Human Body Model (HBM)
+/-4000
V
Charged Device Model (CDM)
+/-1000



Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14


Datasheet Download

Go To PDF Page


Link URL



Does ALLDATASHEET help your business so far?  [ DONATE ] 

About Alldatasheet   |   Advertisement   |   Contact us   |   Privacy Policy   |   Link to Datasheet    |   Link Exchange   |   Manufacturer List
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com