25.2.1 Design Requirements

To design with this device, use the parameters listed in Table 25-1.

Table 25-1. Design Parameters

PARAMETER

VALUE

Supply voltage, VCC1 and VCC2

2.25 V to 5.5 V

Decoupling capacitor between VCC1 and GND1

0.1 µF

Decoupling capacitor from VCC2 and GND2

0.1 µF

25.2.2 Detailed Design Procedure

Unlike optocouplers, which require components to improve performance, provide bias, or limit current, the

ISO7710-Q1 device only requires two external bypass capacitors to operate.

0.1 …F

2 mm

maximum

from V

CC1

0.1 …F

2 mm

maximum

from V

CC2

V

CC1

V

CC2

GND1

GND2

1

2

3

4

8

7

6

5

OUT

IN

INPUT

OUTPUT

Figure 25-2. Typical ISO7710-Q1 Circuit Hook-up

25.2.3 Application Curve

The following typical eye diagram of the ISO7710-Q1 device indicates low jitter and wide open eye at the

maximum data rate of 100 Mbps.

Time = 3.5 ns / div

Figure 25-3. ISO7710-Q1 Eye Diagram at 100 Mbps PRBS, 5-V Supplies and 25°C

25.2.3.1 Insulation Lifetime

Insulation lifetime projection data is collected by using industry-standard Time Dependent Dielectric Breakdown

(TDDB) test method. In this test, all pins on each side of the barrier are tied together creating a two-terminal

device and high voltage applied between the two sides; See Figure 25-4 for TDDB test setup. The insulation

breakdown data is collected at various high voltages switching at 60 Hz over temperature. For reinforced

insulation, VDE standard requires the use of TDDB projection line with failure rate of less than 1 part per million

(ppm). Even though the expected minimum insulation lifetime is 20 years at the specified working isolation

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ISO7710-Q1

SLLSEU2C – MARCH 2017 – REVISED DECEMBER 2024

Copyright © 2024 Texas Instruments Incorporated

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