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AP100N06F Datasheet(PDF) 2 Page - A POWER MICROELECTRONICS |
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AP100N06F Datasheet(HTML) 2 Page - A POWER MICROELECTRONICS |
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2 / 9 page ![]() AP100N06FIPIT 60V N-Channel Enhancement Mode MOSFET AP100N06F/P/T REV1.0 永源微電子科技有限公司 Electrical Characteristics (TJ=25℃, unless otherwise noted) Symbol Parameter Test Conditions Min. Typ. Max. Unit V(BR)DSS Drain-Source Breakdown Voltage VGS = 0V, ID = 250µA 60 - - V lGSS Gate-body Leakage Current VDS = 0V, VGS = ±20V - - ±100 nA IDSS TJ=25°C Zero Gate Voltage Drain Current VDS = 65V, VGS = 0V 1 μA IDSS TJ=100°C 100 μA VGS(th) Gate-Threshold Voltage VDS = VGS, ID = 250µA 2.0 3.0 4.0 V RDS(on) Drain-Source On-Resistance4 VGS = 10V, ID = 20A - 4.8 6.4 mΩ gfs Forward Transconductance4 VDS = 10V, ID = 20A - 58 - S Ciss Input Capacitance VDS = 30V, VGS =0V, f =1MHz - 1230 - pF Coss Output Capacitance - 470 - Crss Reverse Transfer Capacitance - 22 - RG Gate Resistance f =1MHz - 1.8 - Ω Qg Total Gate Charge VGS = 10V, VDS = 30V, ID= 20A - 19 - nC Qgs Gate-Source Charge - 5.4 - Qgd Gate-Drain Charge - 4.9 - td(on) Turn-on Delay Time VGS = 10V, VDD = 30V, RG = 3Ω, ID = 20A - 9.5 - ns tr Rise Time - 5 - td(off) Turn-off Delay Time - 16.5 - tf Fall Time - 6 - trr Body Diode Reverse Recovery Time IF = 20A, di/dt = 100A/μs - 38 - ns Qrr Body Diode Reverse Recovery Charge - 30 - nC VSD Diode Forward Voltage4 IS = 20A, VGS = 0V - - 1.2 V IS Continuous Source Current TC=25°C 100 A Note : 1、The data tested by surface mounted on a 1 inch 2 FR-4 board with 2OZ copper. 2、The data tested by pulsed , pulse width .The EAS data shows Max. rating . 3、The power dissipation is limited by 175 ℃ junction temperature 4、EAS condition: TJ=25 ℃, VDD=48V, VG=10V, RG=25Ω, L=0.1mH, IAS= 22A 5、The data is theoretically the same as ID and IDM , in real applications , should be limited by total power dissipation. . |
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