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CMV20000 Datasheet(PDF) 39 Page - ams-OSRAM AG |
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CMV20000 Datasheet(HTML) 39 Page - ams-OSRAM AG |
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39 / 69 page ![]() CMV20000 Functional description Datasheet • PUBLIC • Document Feedback DS000440 • v3-00 • 2026-Mar-13 39 / 69 / 7.3.7 Test pattern Instead of sending image data, the sensor can generate a fixed two-dimensional test image (after sending a frame request), if the test pattern mode is enabled. This setting can be programmed in the register by setting register 83[0] to 1. The test pattern is the sum of the row number, the pixel number and the data output channel number. Figure 24 shows an example of the test pattern data. Figure 24: Test pattern data IDLE TP 0,1,...639 TP DATA_OUT_ BOT_0 2,3,...641 TP 4,5,...643 TP 6,7,...645 Row 0 Row 2 Row 4 Row 6 IDLE TP 1,2,...640 TP DATA_OUT_ TOP_0 3,4,...642 TP 5,6,...644 TP 7,8,...646 Row 1 Row 3 Row 5 Row 7 IDLE TP 1,2,...640 TP DATA_OUT_ BOT_1 3,4,...642 TP 5,6,...644 TP 7,8,...646 Row 0 Row 2 Row 4 Row 6 IDLE TP 2,3,...641 TP DATA_OUT_ TOP_1 4,5,...643 TP 6,7,...645 TP 8,9,...647 Row 1 Row 3 Row 5 Row 7 IDLE TP 7,8,...646 TP DATA_OUT_ BOT_7 9,10,...648 TP 11,12,...650 TP 13,14,...652 Row 0 Row 2 Row 4 Row 6 IDLE TP 8,9,...647 TP DATA_OUT_ TOP_7 10,11,...649 TP 12,13,...651 TP 14,15,...653 Row 1 Row 3 Row 5 Row 7 ... ... ... ... ... ... ... ... ... ... |
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