74HC_HCT32

All information provided in this document is subject to legal disclaimers.

© NXP Semiconductors N.V. 2015. All rights reserved.

Product data sheet

Rev. 6 — 3 December 2015

8 of 16

NXP Semiconductors

74HC32; 74HCT32

Quad 2-input OR gate

Test data is given in Table 9.

Definitions test circuit:

RT = termination resistance should be equal to output impedance Zo of the pulse generator.

CL = load capacitance including jig and probe capacitance.

Fig 7.

Test circuit for measuring switching times

Table 9.

Test data

Type

Input

Load

Test

VI

tr, tf

CL

74HC32

VCC

6.0 ns

15 pF, 50 pF

tPLH, tPHL

74HCT32

3.0 V

6.0 ns

15 pF, 50 pF

tPLH, tPHL