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E629AXF Datasheet(PDF) 1 Page - Semtech Corporation |
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E629AXF Datasheet(HTML) 1 Page - Semtech Corporation |
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1 / 16 page  TEST AND MEASUREMENT PRODUCTS 1 www .semtech.com Edge629 1 GHz Timing Deskew and Quad Fanout Element Description Featur es Functional Block Diagram Applications Revision 3 / August 1, 2005 • Fmax ≥ 1 GHz • Independent Falling Edge Adjust • Small Footprint (10 mm x 10 mm) • Excellent Timing Accuracy • Very Stable Timing Delays • 5 ps Resolution • ECL, CMOS Compatible Inputs • Memory Test Equipment – Data Fanout – Channel Deskew • Logic Testers – Per Pin Deskew • Clock / Signal Fanout ∆T ∆T– ∆T Coarse Fine OUT0 / OUT0* IN0 / IN0* IN / IN* Coarse Fine OUT1 / OUT1* IN1/ IN1* Coarse Fine OUT2 / OUT2* IN2 / IN2* Coarse Fine OUT3 / OUT3* IN3 / IN3* SEL / SEL* ∆T ∆T ∆T ∆T ∆T ∆T ∆T– ∆T– ∆T– The Edge629 is a monolithic timing delay and signal fanout solution manufactured in a high-performance bipolar pro- cess. In Automatic Test Equipment (ATE) applications, the Edge629 buffers, distributes, and aligns timing signals across multiple channels (typically found inside Memory Test Systems). It is also suitable for per pin deskew in Logic Testers. The Edge629 supports: • Minimum pulse width = 330 ps with Falling Edge Adjust disabled, 500 ps with Falling Edge Adjust enabled • Net usable delay span ≥ 4.0 ns • Falling Edge Adjust ± 250 ps • On Board DACs to generate 5 ps resolution With a maximum operating frequency of 1 GHz, the Edge629 is optimized for extremely high speed, high ac- curacy testers, particularly those aimed to test memory devices. The Edge629 solves several difficult problems associated with aligning multiple timing signals because it can: • delay very narrow pulses over a long timing span • adjust the falling edge independently from the overall propagation delay • maintain extreme timing accuracy for very narrow (sub-ns) pulses • maintain tight timing accuracy over changes in frequency, duty cycle, and pattern. |
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