LT5570

9

5570f

TEST CIRCUITS

1

2

1

5

3

2

4

4

5

3

10

9

7

6

8

GND

FLTR

EN

DNC

OUT

DNC

DEC

RF

INPUT

C1

22nF

5V

ENABLE

OUT

NC

NC

1:4

T1

L1

J1

5570 F01

C6

(OPT)

LT5570

EXPOSED PAD

C2

1nF

C7

C3

1 F

R1

100k

C4

1nF

Figure 1. Test Schematic for 880MHz, 2140MHz and 2700MHz Applications

Figure 2. Top Side of Evaluation Board for 880MHz, 2140MHz and 2700MHz Applications

REF DES

VALUE

SIZE

PART NUMBER

C2, C4

1nF

0402

AVX 0402ZC102KAT

C1

22nF

0402

AVX 0402YC223KAT

C3

1μF

0603

Taiyo Yuden LMK107BJ105MA

R1

100k

0402

CRCW0402100KFKED

FREQUENCY

T1

L1

L1 P/N

C7

880MHz

MURATA LDB21869M20C-001

8.2nH

TOKO LL1005-FH8N25

2.7pF

MURATA GRM1555C1H2R7DZ01

2140MHz

MURATA LDB212G1020-001

3.3nH

TOKO LL1005-FH3N35

0.5pF

MURATA GRM1555C1HR50CZ01

2700MHz

MURATA LDB212G4020-001

1.2nH

TOKO LL1005-FH1N25

1pF

MURATA GRM1555C1H1R0DZ01