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LTC2494 Datasheet(PDF) 32 Page - Linear Technology |
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LTC2494 Datasheet(HTML) 32 Page - Linear Technology |
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32 / 36 page ![]() LTC2494 32 2494fb APPLICATIONS INFORMATION The user can expect to achieve this level of performance using the internal oscillator, as shown in Figures 23, 24, and 25. Measured values of normal mode rejection are shown superimposed over the theoretical values in all three rejection modes. Traditional high order delta-sigma modulators suffer from potential instabilities at large input signal levels. The proprietary architecture used for the LTC2494 third order modulator resolves this problem and guarantees stability with input signals 150% of full-scale. In many industrial applications, it is not uncommon to have mi- crovolt level signals superimposed over unwanted volt level error sources with several volts of peak-to-peak noise. Figures 26 and 27 show measurement results for the rejection of a 7.5V peak-to-peak noise source (150% of full scale) applied to the LTC2494. From these curves, it is shown that the rejection performance is maintained even in extremely noisy environments. Using the 2x speed mode of the LTC2494 alters the rejec- tion characteristics around DC and multiples of fS. The device bypasses the offset calibration in order to increase the output rate. The resulting rejection plots are shown in Figures 28 and 29. 1x type frequency rejection can be achieved using the 2x mode by performing a running average of the conversion results (see Figure 30). Output Data Rate When using its internal oscillator, the LTC2494 produces up to 15 samples per second (sps) with a notch frequency of 60Hz. The actual output data rate depends upon the length of the sleep and data output cycles which are controlled by the user and can be made insignificantly short. When operating with an external conversion clock (FO connected to an external oscillator), the LTC2494 output data rate can be increased. The duration of the conversion cycle is 41036/fEOSC. If fEOSC = 307.2kHz, the converter behaves as if the internal oscillator is used. An increase in fEOSCoverthenominal307.2kHzwilltranslate into a proportional increase in the maximum output data rate (up to a maximum of 100sps). The increase in output rate leads to degradation in offset, full-scale error, and ef- fective resolution as well as a shift in frequency rejection. When using the integrated temperature sensor, the internal Figure 23. Input Normal Mode Rejection vs Input Frequency with Input Perturbation of 100% (60Hz Notch) Figure 24. Input Normal Mode Rejection vs Input Frequency with Input Perturbation of 100% (50Hz Notch) Figure 25. Input Normal Mode Rejection vs Input Frequency with Input Perturbation of 100% (50Hz/60Hz Notch) INPUT FREQUENCY (Hz) 0 15 30 45 60 75 90 105 120 135 150 165 180 195 210 225 240 2494 F23 0 –20 –40 –60 –80 –100 –120 VCC = 5V VREF = 5V VIN(CM) = 2.5V VIN(P-P) = 5V TA = 25°C MEASURED DATA CALCULATED DATA INPUT FREQUENCY (Hz) 0 12.5 25 37.5 50 62.5 75 87.5 100 112.5 125 137.5 150 162.5 175 187.5 200 2494 F24 0 –20 –40 –60 –80 –100 –120 VCC = 5V VREF = 5V VIN(CM) = 2.5V VIN(P-P) = 5V TA = 25°C MEASURED DATA CALCULATED DATA INPUT FREQUENCY (Hz) 0 20 40 60 80 100 120 140 160 180 200 220 2494 F25 0 –20 –40 –60 –80 –100 –120 VCC = 5V VREF = 5V VIN(CM) = 2.5V VIN(P-P) = 5V TA = 25°C MEASURED DATA CALCULATED DATA oscillator should be used (FO = 0) or an external oscillator applied to FO, fEOSC, should be set to 307.2kHz Max. A change in fEOSC results in a proportional change in the internal notch position. This leads to reduced differential mode rejection of line frequencies. The common mode |
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