SS-02 R6

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Specifications given herein may be changed at any time without prior notice. Please confirm technical specifications before you order and/or use.

KOA SPEER ELECTRONICS, INC.

12

Test circuit is shown below.

1 sec. on and 1 sec. off 20,000 cycles.

The voltage is applied with maximum pulse

voltage shown in Table 1.

Resistance change shall

be ± 5% of the Pre-test

value.

Resistance to pulse

10k ohm

SW

C = 1000pF

Rx

DC

5. Characteristics (Continued)

13

Initial resistance shall be measured. The resistors

shall then be exposed to the air stream at -40°C ±

3°C for 24 hours with no voltage applied, after

which the resistors shall be placed at room

temperature, final resistance shall be measured.

Resistance change shall

be ± 5% of the Pre-test

value.

Low Temperature

Operation

14

Thermal Shock

(Method 107)

Resistance change shall

be ± (2% ± 0.05 ohm) of

the Pre-test value.

Initial resistance shall be measured. The resistors

shall be subjected to the temperature cycle speci-

fied below for a total of five cycles, performed con-

tinuously. Temperatures in Steps 1 and 3 shall be

maintained by forced air circulation. The hot and

cold chambers shall be of such capacity that air

temperature will reach the temperatures specified

in Table 4 within 2 minutes after the resistors have

been placed in the appropriate chamber. Final

resistance shall be measured approximately one

hour after completion of the fifth cycle.

Thermal Shock Test Sequence

Step

Temperature (°C)

Time (min.)

1

-40 ± 3

30

2

+25 ± 5

10 ~ 15

3

+85 ± 2

30

4

+25 ± 5

10 ~ 15

15

Moisture Resistance

Resistance change shall

be ± 5% of the Pre-test

value.

Initial resistance shall be measured before the

test. Resistors shall be exposed to a temperature

of 40 ± 2°C and a relative humidity of 90 - 95%, for

1,000 hours. After removal from the chamber, the

resistors shall be allowed to dry at room ambient

for approximately one hour. Final resistance shall

be measured.

SS-02 R6

6/20/07

3:37 PM

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