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SN74F151B Datasheet(PDF) 3 Page - Texas Instruments |
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SN74F151B Datasheet(HTML) 3 Page - Texas Instruments |
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3 / 5 page ![]() SN54F151B, SN74F151B 1-OF-8 DATA SELECTORS/MULTIPLEXERS SDFS023A – D2932, MARCH 1987 – REVISED OCTOBER 1993 2–3 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 logic diagram (positive logic) Data Select (binary) Data Inputs D0 D1 D2 D3 D4 D5 D6 D7 G W Y C A B 7 4 3 2 1 15 14 13 12 11 10 9 5 6 Pin numbers shown are for the D, J, and N packages. absolute maximum ratings over operating free-air temperature range (unless otherwise noted)† Supply voltage range, VCC – 0.5 V to 7 V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Input voltage range (see Note 1) – 1.2 V to 7 V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Input current range – 30 mA to 5 mA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Voltage range applied to any output in the high state – 0.5 V to VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Current into any output in the low state: SN54F151B 40 mA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . SN74F151B 48 mA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Operating free-air temperature range: SN54F151B – 55 °C to 125°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . SN74F151B 0 °C to 70°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Storage temperature range – 65 °C to 150°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . † Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. NOTE 1: The input voltage rating may be exceeded provided that the input current rating is observed. |
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