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THS8134B Datasheet(PDF) 13 Page - Texas Instruments |
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THS8134B Datasheet(HTML) 13 Page - Texas Instruments |
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13 / 24 page ![]() THS8134, THS8134A, THS8134B TRIPLE 8-BIT, 80 MSPS VIDEO D/A CONVERTER WITH TRI-LEVEL SYNC GENERATION SLVS205D – MAY 1999 – REVISED MARCH 2000 13 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 electrical characteristics over recommended operating conditions with fCLK = 80 MSPS and use of internal reference voltage Vref, with R(FS) = R(FSnom) (unless otherwise noted) (continued) analog (DAC) outputs PARAMETER TEST CONDITIONS MIN TYP MAX UNIT DAC resolution 8 8 bits INL Integral nonlinearity Static, best fit ±0.2 ±1.2 LSB DNL Differential nonlinearity Static ±0.2 ±1 LSB PSRR Power supply ripple rejection ratio of DAC f = 100 kHz (see Note 4) 37 dB PSRR yj output (full scale) f = 1 MHz (see Note 4) 43 dB XTALK Crosstalk between channels f up to 30 MHz, (see Note 5) –55 dB VO(ref) Voltage reference output 1.30 1.35 1.40 V ro(VREF) VREF output resistance 7K 11K 15K W G(DAC) DAC gain factor See Table 4 Imbalance between DACs, (KIMBAL) See Note 6 ±5% Imbalance between positive and negative sync, (KIMBAL(SYNC)) See Note 6 ±2% VO( C) DAC output compliance voltage (sync+video) RL = 37.5 Ω, See Note 7 1 1.2 V VO(DAC) DAC output compliance voltage (sync+video) RL = 75 Ω, See Note 7 2 2.4 V Internal reference AGY 24 26.67 28 GBR sync-on-green and YPbPr sync-on-Y/sync- Internal reference ABPb and ARPr 17.3 18.67 19.7 mA yg y y on-all External reference AGY 24.9 26.67 27.2 mA I(S) External reference ABPb and ARPr 17.5 18.67 19.3 I(FS) Internal reference AGY 24 26.67 28 GBR sync on all Internal reference ABPb and ARPr 24 26.67 28 mA GBR sync-on-all External reference AGY 24.9 26.67 27.2 mA External reference ABPb and ARPr 24.9 26.67 27.2 ro DAC output resistance See Note 10 57 92 k Ω CO DAC output capacitance (pin capacitance) 8 pF tr(DAC) DAC output current rise time 10% to 90% of full scale 2 ns tf(DAC) DAC output current fall time 10% to 90% of full scale 2 ns td(A) Analog output delay Measured from CLK=VIH(min) to 50% of full-scale transition, See Note 8 9 ns tS Analog output settling time Measured from 50% of full scale transition on output to output settling, within 2%, See Note 9 5 9 ns SNR Signal -to-noise ratio 1 MHz, –1 dBFS digital sine input, measured from 0 MHz to 8.8 MHz 53 dB SFDR Spurious-free dynamic range 1 MHz, –1 dBFS digital sine input, measured from 0 MHz to 8.8 MHz 62 dB BW(1 dB) Bandwidth See Note 11 40 MHz NOTES: 4. PSRR is measured with a 0.1 µF capacitor between the COMP and AVDD terminal; with a 0.1 µF capacitor connected between the VREF terminal and AVSS. The ripple amplitude is within the range 100 mVp-p to 500 mVp-p with the DAC output set to full scale and a double-terminated 75 Ω (=37.5 Ω) load. PSRR is defined as 20 × log(ripple voltage at DAC output/ripple voltage at AVDD input). Limits from characterization only. 5. Crosstalk spec applies to each possible pair of the 3 DAC outputs. Limits from characterization only. 6. The imbalance between DACs applies to all possible pairs of the three DACs. KIMBAL is assured over full temperature range. In parts labeled THS8134CPHP, KIMBAL(SYNC) is assured at 25°C. In parts labeled THS8134ACPHP, KIMBAL(SYNC) is assured over the full temperature range. 7. Nominal values at R(FS) = R(FSnom) : Maximum values at R(FS) = R(FSnom) ÷ 1.2. Maximum limits from characterization only. 8. This value excludes the digital process delay, td(D). Limit from characterization only. 9. Maximum limit from characterization only 10. Limit from characterization only 11. This bandwidth relates to the output amplitude variation in excess of the droop from the sinx/x sampled system. Since the output is a sample-and-hold signal, a sin( π × Fin ÷ Fclk) ÷ (π × Fin ÷ Fclk) roll-off is observed, which accounts e.g. at Fin = 40 MHz and Fclk = 80 MSPS for –3.92 dB signal drop (sync droop). The total DAC output variation (device droop) consists of this and an additional amount (excess droop) caused by the output impedance of the device, as shown in Table 5. |
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